Inventor
Stephan Kannengießer
Inventor
Wuppertal, DE
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
10,024,942Magnetic resonance method and apparatus to generate a residual map as an indicator of signal model consistency20189,880,249'Method for determining distortion-reduced magnetic resonance data and magnetic resonance system'20189,297,872'Dynamic adaptation of a degree of signal compression for MRT image processing'20168,143,891'System for image acquisition with fast magnetic resonance gradient echo sequences'20127,319,324'MRI method and apparatus using PPA image reconstruction'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2018Patents assigned to SIEMENS AG (4)· patent assignee history
2008Based in Erlangen, DE· patent location history
2012Patents assigned to KANNENGIEBETAER STEPHAN (1)· patent assignee history
2012Patents assigned to PRIATNA AGUS (1)· patent assignee history
2012–2018Based in Wuppertal, DE· patent location history
2016Patents assigned to BIBER STEPHAN (1)· patent assignee history
2016Patents assigned to KANNENGIEΒER STEPHAN (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SIEMENS AG | 4 | 2008–2018 |
| BIBER STEPHAN | 1 | 2016 |
| KANNENGIEBETAER STEPHAN | 1 | 2012 |
| KANNENGIEΒER STEPHAN | 1 | 2016 |
| PRIATNA AGUS | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Wuppertal, DE | 4 | 2012–2018 |
| Erlangen, DE | 1 | 2008 |