Inventor
Masakazu Ando
Inventor
Nagoya, JP
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
F24Hprimary
F24HFluid heaters, e.g. water or air heaters, having heat-generating means, e.g. heat pumps, in general23%
G01RMeasuring electric variables16%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
F23NRegulating or controlling combustion5%
F24DDomestic- or space-heating systems, e.g. central heating systems5%
H03KPulse technique5%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications5%
B01DSeparation2%
B60NSeats specially adapted for vehicles2%
F16BDevices for fastening or securing constructional elements or machine parts together, e.g. nails, bolts, circlips, clamps, clips or wedges2%
PatentTitleYear
10,481,012Heat exchanger201910,309,686Forced air supply type of combustion apparatus201910,252,649Vibration damping device and vehicle seat provided with the vibration damping device201910,234,171Attachment structure for water heater20199,228,759'Circulating-type hot-water supply device'20168,653,843'Temperature control device and temperature control method'20148,584,625'Storage type water heater'20138,322,313'Hot water storage type hot water supply device'20128,267,051'Water heater'20128,063,653'Temperature control device and temperature control method'20117,876,120'Test apparatus, pin electronics card, electrical device and switch'20117,874,288'Gas combustion apparatus'20117,619,427'Temperature control device and temperature control method'20097,597,066'Circulation type hot water supply device'20097,591,434'Hot water supply system'2009D0568477'Radiographic image reader for medical purposes'20086,191,426'Cassette'20015,699,001'Driver circuit for semiconductor test system'19975,654,655'Driver circuit for semiconductor test system'19975,398,092'Method and apparatus for developing lithographic offset printing plate'19954,710,704'IC test equipment'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987–2014Patents assigned to ADVANTEST CORP (7)· patent assignee history
1987–2009Based in Gyoda, JP· patent location history
1995–2014Based in Tokyo, JP· patent location history
2009–2019Patents assigned to RINNAI KK (10)· patent assignee history
2009–2019Based in Nagoya, JP· patent location history
2009Based in Nagoy, JP· patent location history
2011–2014Patents assigned to ANDO MASAKAZU (5)· patent assignee history
2011–2014Patents assigned to HASHIMOTO TAKASHI (2)· patent assignee history
2011–2014Patents assigned to TAKAHASHI HIROYUKI (2)· patent assignee history
2019Based in Yokohama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RINNAI KK | 10 | 2009–2019 |
| ADVANTEST CORP | 7 | 1987–2014 |
| ANDO MASAKAZUself | 5 | 2011–2014 |
| HASHIMOTO TAKASHI | 2 | 2011–2014 |
| TAKAHASHI HIROYUKI | 2 | 2011–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nagoya, JP | 9 | 2009–2019 |
| Tokyo, JP | 5 | 1995–2014 |
| Gyoda, JP | 4 | 1987–2009 |
| Yokohama, JP | 1 | 2019 |
| Nagoy, JP | 1 | 2009 |