Inventor
Friedhelm Caspers
Inventor
Bochum, DE
Overview
Patents· 2 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions100%
PatentTitleYear
4,520,308'Process and device for the nondestructive measurement of material accumulations or coating thicknesses on dielectric materials, in particular plastic'19854,492,915'Method and apparatus for the electronic measurement of the thickness of very thin electrically conductive films on a nonconductive substrate'1985Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1985Patents assigned to NIX STEINGROEVE ELEKTRO PHYSIK (2)· patent assignee history
1985Based in Bochum, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NIX STEINGROEVE ELEKTRO PHYSIK | 2 | 1985 |
Locations
| Location | Patents | Span |
|---|---|---|
| Bochum, DE | 2 | 1985 |