Inventor
Jinjun Xiong
Inventor
White Plains, NY, US
Overview
Patents· 40 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing28%
G01RMeasuring electric variables20%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes8%
G05BControl or regulating systems in general7%
H02JElectric power networks7%
Y02PClimate change mitigation technologies in the production or processing of goods5%
G01MTesting static or dynamic balance of machines or structures3%
G05FSystems for regulating electric or magnetic variables3%
G07CTime or attendance registers3%
H04RLoudspeakers, microphones, gramophone pick-ups or like acoustic electromechanical transducers3%
PatentTitleYear
10,591,945Parallel technique for computing problem functions in solving optimal power flow202010,460,403System and method to reduce human activity damage-induced power outage201910,218,300Transformer phase permutation causing more uniform transformer phase aging and general switching network suitable for same201910,061,841Fast path traversal in a relational database-based graph structure201810,013,289Performing automatic map reduce job optimization using a resource supply-demand based approach20189,959,514Optimized asset maintenance and replacement schedule20189,959,515Optimized asset maintenance and replacement schedule20189,836,434Runtime of CUBLAS matrix multiplication on GPU20179,733,630'Interactive energy device for environmental stewardship'20179,665,538'Solving satisfiability problems through search'20179,599,973'Interactive energy device for environmental stewardship'20179,552,007'Parallel technique for computing problem functions in solving optimal power flow'20179,332,362'Acoustic diagnosis and correction system'20169,260,031'Distributed charging of electrical assets'20169,104,834'Systems and methods for single cell product path delay analysis'20159,058,034'Integrated circuit product yield optimization using the results of performance path testing'20158,964,995'Acoustic diagnosis and correction system'20158,904,329'Systems and methods for single cell product path delay analysis'20148,781,792'Yield computation and optimization for selective voltage binning'20148,676,536'Method and apparatus for selecting voltage and frequency levels for use in at-speed testing'20148,571,825'Design-dependent integrated circuit disposition'20138,560,994'Enabling statistical testing using deterministic multi-corner timing analysis'20138,560,980'Optimal chip acceptance criterion and its applications'20138,543,966'Test path selection and test program generation for performance testing integrated circuit chips'20138,538,715'Design-dependent integrated circuit disposition'20138,510,696'Ordering of statistical correlated quantities'20138,490,040'Disposition of integrated circuits using performance sort ring oscillator and performance path testing'20138,359,565'Method and apparatus for generating test patterns for use in at-speed testing'20138,340,939'Method and apparatus for selecting paths for use in at-speed testing'20128,266,565'Ordering of statistical correlated quantities'20128,176,462'Method and apparatus for generating test patterns for use in at-speed testing'20128,104,005'Method and apparatus for efficient incremental statistical timing analysis and optimization'20127,971,120'Method and apparatus for covering a multilayer process space during at-speed testing'20117,886,247'Method and apparatus for statistical path selection for at-speed testing'20117,873,925'Method and apparatus for computing test margins for at-speed testing'20117,861,199'Method and apparatus for incrementally computing criticality and yield gradient'20107,814,448'Representing and propagating a variational voltage waveform in statistical static timing analysis of digital circuits'20107,620,921'IC chip at-functional-speed testing with process coverage evaluation'20097,480,880'Method, system, and program product for computing a yield gradient from statistical timing'20097,437,697'System and method of criticality prediction in statistical timing analysis'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2019Patents assigned to IBM (39)· patent assignee history
2008–2009Based in Los Angeles, CA, US· patent location history
2009–2020Based in White Plains, NY, US· patent location history
2012–2016Patents assigned to XIONG JINJUN (17)· patent assignee history
2012–2014Patents assigned to ZOLOTOV VLADIMIR (9)· patent assignee history
2012–2014Patents assigned to VISWESWARIAH CHANDRAMOULI (8)· patent assignee history
2012–2013Based in Ossining, NY, US· patent location history
2013–2015Patents assigned to BICKFORD JEANNE P (3)· patent assignee history
2018Based in Golden Bridge, NY, US· patent location history
2019Based in Goldens Bridge, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 39 | 2008–2019 |
| XIONG JINJUNself | 17 | 2012–2016 |
| ZOLOTOV VLADIMIR | 9 | 2012–2014 |
| VISWESWARIAH CHANDRAMOULI | 8 | 2012–2014 |
| BICKFORD JEANNE P | 3 | 2013–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| White Plains, New York, US | 32 | 2009–2020 |
| Goldens Bridge, New York, US | 2 | 2019 |
| Ossining, New York, US | 2 | 2012–2013 |
| Los Angeles, California, US | 2 | 2008–2009 |
| Golden Bridge, New York, US | 1 | 2018 |