Inventor
Shih-Chia Kao
Inventor
Taipei, TW
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables62%
G06FElectric digital data processing33%
G11CStatic stores5%
PatentTitleYear
9,057,763'Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test'20159,026,875'Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test'20158,769,359'Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test'20148,543,950'Computer-aided design system to automate scan synthesis at register-transfer level'20137,904,773'Multiple-capture DFT system for scan-based integrated circuits'20117,779,323'Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test'20107,444,567'Method and apparatus for unifying self-test with scan-test during prototype debug and production test'20087,441,165'Read-only memory and operational control method thereof'20087,331,032'Computer-aided design system to automate scan synthesis at register-transfer level'20087,191,373'Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques'20077,058,869'Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits'20067,007,213'Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test'20066,957,403'Computer-aided design system to automate scan synthesis at register-transfer level'20056,954,887'Multiple-capture DFT system for scan-based integrated circuits'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2015Patents assigned to SYNTEST TECHNOLOGIES INC (13)· patent assignee history
2005–2015Based in Taipei, TW· patent location history
2013Patents assigned to HSU FEI-SHENG (1)· patent assignee history
2013Patents assigned to KAO SHIH-CHIA (1)· patent assignee history
2013Patents assigned to KIFLI AUGUSLI (1)· patent assignee history
2013Patents assigned to LIN SHYH-HORNG (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SYNTEST TECHNOLOGIES INC | 13 | 2005–2015 |
| HSU FEI-SHENG | 1 | 2013 |
| KAO SHIH-CHIAself | 1 | 2013 |
| KIFLI AUGUSLI | 1 | 2013 |
| LIN SHYH-HORNG | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Taipei, TW | 14 | 2005–2015 |