Inventor
Bozidar Janko
Inventor
Portland, OR, US
Overview
Patents· 27 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Nprimary
H04NPictorial communication, e.g. television31%
G01RMeasuring electric variables22%
H01JElectric discharge tubes or discharge lamps17%
G06TImage data processing or generation, in general6%
H05KPrinted circuits6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests6%
G06FElectric digital data processing3%
H03KPulse technique3%
H03MCoding3%
H04LTransmission of digital information, e.g. telegraphic communication3%
PatentTitleYear
7,773,112'Automatic measurement of video parameters'20107,061,920'Streaming media quality analyzer system'20066,795,580'Picture quality measurement using blockiness'20046,690,840'Image alignment with global translation and linear stretch'20046,671,409'Blockiness period detection of DCT-based codecs'20036,633,329'Frozen field detection of formerly encoded video'20036,437,821'Harmonic measurement of blockiness in video signals'20026,433,819'Detection of Gaussian noise in video signals'20026,377,297'Detection of repeated and frozen frames in a video signal'20026,075,561'Low duty-cycle transport of video reference images'20005,940,124'Attentional maps in objective measurement of video quality degradation'19995,818,520'Programmable instrument for automatic measurement of compressed video quality'19985,321,365'Reduced noise sensitivity in inverse scattering through filtering'19945,221,895'Probe with microstrip transmission lines'19935,202,622'Adapter and test fixture for an integrated circuit device package'19935,166,609'Adapter and test fixture for an integrated circuit device package'19925,015,946'High density probe'19914,963,821'Probe and method for testing a populated circuit board'19904,950,981'Apparatus for testing a circuit board'19904,891,585'Multiple lead probe for integrated circuits in wafer form'19904,623,819'Accelerating and scan expansion electron lens means for a cathode ray tube'19864,277,722'Cathode ray tube having low voltage focus and dynamic correction'19814,207,492'Slow-wave high frequency deflection structure'19804,188,563'Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens'19804,137,479'Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens'19794,110,749'Touch display to digital encoding system'19784,075,533'Electron beam forming structure utilizing an ion trap'1978Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1978–2010Patents assigned to TEKTRONIX INC (27)· patent assignee history
1978–2010Based in Portland, OR, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEKTRONIX INC | 27 | 1978–2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| Portland, OR, US | 27 | 1978–2010 |