Inventor
Seiji Nakagawa
Inventor
Ryugasaki, JP
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices10%
G11BInformation storage based on relative movement between record carrier and transducer10%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G05BControl or regulating systems in general7%
G06TImage data processing or generation, in general7%
A24BManufacture or preparation of tobacco for smoking or chewing3%
B05DProcesses for applying fluent materials to surfaces, in general3%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors3%
D21GCalenders3%
PatentTitleYear
10,358,794Work vehicle201910,051,882Basis weight measuring apparatus and method for sheet tobacco, and manufacturing system and method for sheet tobacco2018D0693853'Wheel loader'20138,125,734'Magnetic slider, head gimbal assembly and method for manufacturing the same'20128,073,316'Oven for semiconductor wafer'20117,803,720'Coating process and equipment for reduced resist consumption'20107,474,212'Object tagged with RFID tag and device and method for processing it'20097,457,741'Device for transmitting speech information'20087,235,490'Method of manufacturing semiconductor device'20077,088,224'Audio information transmitting apparatus and the method thereof, and a vibrator holding structure'20066,777,350'Method and device of forming a film using a coating material and method of manufacturing a semiconductor device'20046,681,155'Optimizing control method and optimizing control system for power plant'20046,628,380'Appearance inspecting jig for small parts and inspecting method employing the same jig'20035,969,798'Image inspection apparatus in plate making process and image inspection method in plate making process'19995,885,755'Developing treatment apparatus used in the process for manufacturing a semiconductor device, and method for the developing treatment'19995,754,370'Wired suspension assembly in disk storage device method for assembly head suspension assembly'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2003Patents assigned to IBM (2)· patent assignee history
1999–2011Patents assigned to TOSHIBA KK (6)· patent assignee history
1999Patents assigned to D S TECHNICAL RESEARCH CO LTD (1)· patent assignee history
1999–2004Based in Yokohama, JP· patent location history
2003–2012Based in Kanagawa, JP· patent location history
2008Patents assigned to AIST (1)· patent assignee history
2010–2011Based in Oita, JP· patent location history
2011–2012Patents assigned to NAKAGAWA SEIJI (2)· patent assignee history
2013–2019Based in Ryugasaki, JP· patent location history
2018Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOSHIBA KK | 6 | 1999–2011 |
| IBM | 2 | 1998–2003 |
| NAKAGAWA SEIJIself | 2 | 2011–2012 |
| AIST | 1 | 2008 |
| D S TECHNICAL RESEARCH CO LTD | 1 | 1999 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ryugasaki, JP | 2 | 2013–2019 |
| Kanagawa, JP | 2 | 2003–2012 |
| Oita, JP | 2 | 2010–2011 |
| Yokohama, JP | 2 | 1999–2004 |
| Tokyo, JP | 1 | 2018 |