Inventor
Uwe Graf
Inventor
Solms, DE
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus60%
G01NInvestigating or analysing materials by determining their chemical or physical properties30%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light10%
PatentTitleYear
8,154,718'Apparatus and method for inspecting micro-structured devices on a semiconductor substrate'20127,271,889'Device and method for inspecting an object'20077,002,740'Setting module for the illumination of an optical instrument'20066,879,440'Autofocus module and method for a microscope-based system'20056,713,746'Arrangement and method for illuminating a specimen field in an optical instrument'20046,696,679'Method for focusing of disk-shaped objects with patterned surfaces during imaging'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2007Patents assigned to LEICA MICROSYSTEMS (5)· patent assignee history
2004–2012Based in Solms, DE· patent location history
2012Patents assigned to DANNER LAMBERT (1)· patent assignee history
2012Patents assigned to GRAF UWE (1)· patent assignee history
2012Patents assigned to VISTEC SEMICONDUCTOR SYS GMBH (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| LEICA MICROSYSTEMS | 5 | 2004–2007 |
| DANNER LAMBERT | 1 | 2012 |
| GRAF UWEself | 1 | 2012 |
| VISTEC SEMICONDUCTOR SYS GMBH | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Solms, DE | 6 | 2004–2012 |