Inventor
Atsuhiro Tsuchiya
Inventor
Hachioji, JP
Overview
Patents· 40 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus52%
C12MApparatus for enzymology or microbiology13%
LOC1311%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
A61BDiagnosis5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
B41JTypewriters4%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
PatentTitleYear
D0920244Inverter2021D0920245Inverter2021D0920243Inverter2021D0920246Inverter2021D0913920Inverter2021D0909971Inverter202110,495,864Fluorescence observation unit and fluorescence observation apparatus20199,970,922Observation apparatus20189,915,814'Fluorescence observation unit and fluorescence observation apparatus'20188,243,365'Microscope'20128,203,783'Microscope with switchable condenser arrangement for different observation methods'20128,194,313'Microscope and lamphouse'20128,192,982'Tissue culture microscope apparatus'20128,110,394'Culture microscope apparatus'20127,910,355'Culture observation apparatus'20117,822,257'Observation apparatus and observation method'20107,816,126'Culture observation apparatus, sample tray heat-insulating device and lid'20107,799,559'Culture microscope apparatus'20107,612,316'Focus detection device and fluorescent observation device using the same'20097,595,188'Observation apparatus'20097,564,621'Examination apparatus and focusing method of examination apparatus'20097,382,531'Microscope and method of preventing dew condensation on objective lens'20087,345,814'Microscope system and microscope focus maintaining device for the same'20087,333,265'Microscope apparatus'20087,304,282'Focus detection device and fluorescent observation device using the same'20077,304,790'Examination apparatus and focusing method of examination apparatus'20077,301,626'Laser-scanning examination apparatus'20077,268,938'In-vivo examination apparatus'20077,224,524'Total reflection fluorescent microscope'20077,216,945'Recording apparatus and method of controlling the same'20076,940,640'Inverted microscope'20056,789,863'Recording apparatus and method of controlling the same'20046,414,805'Reflected-light type fluorescence microscope and filter cassette used therefor'20026,400,501'Optical microscope'20026,262,837'Fluorescent microscope'20016,226,118'Optical microscope'20016,219,181'Monitor-aided microscope'20016,043,475'Focal point adjustment apparatus and method applied to microscopes'20005,859,727'Objective unit'19995,633,752'Optical switching apparatus for a reflected fluorescence microscope'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2005Patents assigned to OLYMPUS OPTICAL CO (9)· patent assignee history
1997Based in Akigawa, JP· patent location history
1999–2018Based in Hachioji, JP· patent location history
2004–2007Patents assigned to CANON KK (2)· patent assignee history
2004–2007Based in Kanagawa, JP· patent location history
2007–2019Patents assigned to OLYMPUS CORP (22)· patent assignee history
2008–2021Based in Tokyo, JP· patent location history
2012Patents assigned to TSUCHIYA ATSUHIRO (5)· patent assignee history
2021Patents assigned to MITSUBISHI ELECTRIC CORP (6)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OLYMPUS CORP | 22 | 2007–2019 |
| OLYMPUS OPTICAL CO | 9 | 1997–2005 |
| MITSUBISHI ELECTRIC CORP | 6 | 2021 |
| TSUCHIYA ATSUHIROself | 5 | 2012 |
| CANON KK | 2 | 2004–2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hachioji, JP | 23 | 1999–2018 |
| Tokyo, JP | 14 | 2008–2021 |
| Kanagawa, JP | 2 | 2004–2007 |
| Akigawa, JP | 1 | 1997 |