Inventor
Nadya Strelkova
Inventor
Portland, OR, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices67%
G06FElectric digital data processing17%
G06TImage data processing or generation, in general17%
PatentTitleYear
7,434,198'Method and computer program product for detecting potential failures in an integrated circuit design after optical proximity correction'20087,340,706'Method and system for analyzing the quality of an OPC mask'20087,325,222'Method and apparatus for verifying the post-optical proximity corrected mask wafer image sensitivity to reticle manufacturing errors'20087,035,446'Quality measurement of an aerial image'20066,775,818'Device parameter and gate performance simulation based on wafer image prediction'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2008Patents assigned to LSI LOGIC CORP (5)· patent assignee history
2004–2008Based in Portland, OR, US· patent location history
2006Based in Mountain View, CA, US· patent location history
2008Based in Gresham, OR, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| LSI LOGIC CORP | 5 | 2004–2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Portland, OR, US | 3 | 2004–2008 |
| Gresham, OR, US | 1 | 2008 |
| Mountain View, California, US | 1 | 2006 |