Inventor
Nobuhiro Tomatsu
Inventor
Yokohama, JP
Overview
Patents· 45 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
C12Qprimary
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms53%
A61BDiagnosis19%
G01BMeasuring length, thickness or similar linear dimensions5%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
G06TImage data processing or generation, in general5%
C07KPeptides3%
C12NMicroorganisms or enzymes2%
G02BOptical elements, systems or apparatus2%
G06KGraphical data reading2%
G06VImage or video recognition or understanding2%
PatentTitleYear
10,470,653Image processing apparatus, image processing method, and storage medium that generate a motion contrast enface image201910,244,937Image processing apparatus and image processing method201910,136,807Optical coherence tomography system201810,123,698Ophthalmic apparatus, information processing method, and storage medium20189,841,268'Imaging apparatus'20179,700,205'Ophthalmologic apparatus'20179,700,199'Image processing apparatus and image processing method'20179,290,818'Probe, probe set, probe carrier, and testing method'20169,161,690'Ophthalmologic apparatus and control method of the same'20159,149,181'Tomographic imaging apparatus and photographing method'20159,131,840'Optical coherence tomographic imaging apparatus and tomographic imaging method'20158,778,664'Probe, probe set, probe carrier, and testing method'20148,568,983'Probe, probe set, probe carrier, and testing method'20138,530,163'Probe, probe set, probe carrier, and testing method'20138,517,537'Optical coherence tomographic imaging method and optical coherence tomographic imaging apparatus'20138,390,818'Optical coherence tomographic imaging apparatus and optical coherence tomographic imaging method'20138,344,124'Probe, probe set, probe carrier, and testing method'20138,206,912'Probe, probe set, probe carrier, and testing method'20128,206,900'Probe, probe set, probe carrier, and testing method'20128,163,486'Probe, probe set, probe carrier, and testing method'20128,153,371'Probe, probe set, probe carrier, and testing method'20128,049,001'Probe, probe set, probe carrier, and testing method'20118,039,607'Probe, probe set, probe carrier, and testing method'20118,034,918'Probe, probe set, probe carrier, and testing method'20118,034,919'Probe, probe set, probe carrier, and testing method'20118,030,001'Probe, probe set, probe carrier, and testing method'20118,026,061'Probe, probe set, probe carrier, and testing method'20118,003,321'Method of detecting DNA of arthroderma gypseum'20117,998,675'Probe, probe set, probe carrier, and testing method for detecting DNA of Arthroderma incurvatum'20117,993,846'Probe, probe set, probe carrier, and testing method'20117,985,544'Probe, probe set, and probe carrier for detecting DNA of Trichophyton verrucosum'20117,985,545'Probe, probe set, and probe carrier for detecting DNA of Trichophyton violaceum '20117,960,538'Probe, probe set, probe carrier, and testing method'20117,960,539'Probe, probe set, probe carrier, and testing method'20117,951,932'Probe, probe set, probe carrier, and testing method'20117,947,445'Method of detecting DNA of Candida guilliermondii '20117,935,809'Probe, probe set, probe carrier, and testing method'20117,935,810'Probe, probe set, probe carrier, and testing method'20117,932,028'Probe set, probe immobilized carrier and method for detecting microorganisms'20117,906,286'Probe set, probe carrier, and method for determining and identifying fungus'20117,888,026'Probe, probe set, probe carrier, and testing method for detecting DNA of Candida parapsilosis'20117,863,000'Probe, probe set and probe carrier for detecting Candida lusitaniae'20117,858,315'Probe, probe set, probe carrier, and testing method'20107,858,314'Probe, probe set, probe carrier, and testing method'20107,795,418'Probe, probe set, probe carrier, and testing method'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2019Patents assigned to CANON KK (45)· patent assignee history
2010–2019Based in Yokohama, JP· patent location history
2012–2015Patents assigned to TOMATSU NOBUHIRO (13)· patent assignee history
2012–2014Patents assigned to FUKUI TOSHIFUMI (8)· patent assignee history
2012–2014Patents assigned to SHIMIZU NOBUYOSHI (8)· patent assignee history
2012–2014Patents assigned to TAKAYANAGI ATSUSHI (8)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CANON KK | 45 | 2010–2019 |
| TOMATSU NOBUHIROself | 13 | 2012–2015 |
| FUKUI TOSHIFUMI | 8 | 2012–2014 |
| SHIMIZU NOBUYOSHI | 8 | 2012–2014 |
| TAKAYANAGI ATSUSHI | 8 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 45 | 2010–2019 |