Inventor
Ruriko Tsuneta
Inventor
Fuchu, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps52%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
G06TImage data processing or generation, in general9%
G01RMeasuring electric variables6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests6%
B82YSpecific uses or applications of nanostructures3%
G01BMeasuring length, thickness or similar linear dimensions3%
G06KGraphical data reading3%
H01LSemiconductor devices3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
PatentTitleYear
9,830,524Method for estimating shape before shrink and CD-SEM apparatus20178,993,961'Electric charged particle beam microscope and electric charged particle beam microscopy'20158,963,102'Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopy'20158,442,300'Specified position identifying method and specified position measuring apparatus'20138,334,519'Multi-part specimen holder with conductive patterns'20127,863,564'Electric charged particle beam microscope and microscopy'20117,633,064'Electric charged particle beam microscopy and electric charged particle beam microscope'20097,372,051'Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system'20087,372,029'Scanning transmission electron microscope and scanning transmission electron microscopy'20087,227,144'Scanning transmission electron microscope and scanning transmission electron microscopy'20077,141,790'Defect inspection instrument and positron beam apparatus'20066,888,139'Electron microscope'20056,838,667'Method and apparatus for charged particle beam microscopy'20056,570,156'Autoadjusting electron microscope'20036,051,834'Electron microscope'20005,866,905'Electron microscope'19995,650,621'Electron microscope'19975,453,617'Electron microscope for specimen composition and strain analysis and observation method thereof'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995–2012Patents assigned to HITACHI LTD (9)· patent assignee history
1995–2005Based in Kokubunji, JP· patent location history
2005–2015Based in Fuchu, JP· patent location history
2007–2017Patents assigned to HITACHI HIGH TECH CORP (9)· patent assignee history
2008Based in Fucha, JP· patent location history
2012–2017Patents assigned to TSUNETA RURIKO (4)· patent assignee history
2013Patents assigned to ANDO TOHRU (1)· patent assignee history
2013Patents assigned to AZUMA JUNZO (1)· patent assignee history
2015–2017Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 9 | 2007–2017 |
| HITACHI LTD | 9 | 1995–2012 |
| TSUNETA RURIKOself | 4 | 2012–2017 |
| ANDO TOHRU | 1 | 2013 |
| AZUMA JUNZO | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Fuchu, JP | 9 | 2005–2015 |
| Kokubunji, JP | 6 | 1995–2005 |
| Tokyo, JP | 2 | 2015–2017 |
| Fucha, JP | 1 | 2008 |