LexDanaLexDanabeta
Inventor

Takeo Yamada

Inventor
Yokohama, JP

Overview

83→
Patents
1976–2021
Patent span
Physics
Primary field (CPC G)

Patents· 83 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H04Nprimary
H04NPictorial communication, e.g. television11%
G01BMeasuring length, thickness or similar linear dimensions7%
E02FDredging6%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
Y10TTechnical subjects covered by former us classification3%
C01BNon-metallic elements3%
G01KMeasuring temperature3%
F15BSystems acting by means of fluids in general2%
G02BOptical elements, systems or apparatus2%
PatentTitleYear
11,004,474Recording apparatus, reproducing apparatus, recording/reproducing apparatus, image pickup apparatus, recording method, and program202110,787,788Work machine and control method for work machine202010,597,853Measuring jig and hydraulic excavator calibration method202010,439,774Data processing using defined data definitions201910,422,111Hydraulic excavator and hydraulic excavator calibration method201910,136,246Selective pairing of wireless devices using shared keys201810,017,389CNT metal composite material, and method for producing same20189,797,111'Work vehicle'20179,481,976'Work vehicle'20169,382,693'Work vehicle and work vehicle control method'20169,371,626'Work vehicle'20169,126,225'Coating apparatus and coating film manufacturing method'20159,126,835'Carbon nanotube film structure and method for manufacturing the same'20159,121,158'Hydraulic excavator'20158,921,084'Protein-enclosed carbon nanotube film, and sensor and power-generating device each equipped with the carbon nanotube film as electrode'20148,736,851'Film thickness measuring device and film thickness measuring method'20148,623,495'Carbon nanotube film structure and method for manufacturing the same'20148,464,826'Hydraulic traveling vehicle'20138,339,617'Film thickness measuring device and film thickness measuring method'20127,931,099'Hydraulic traveling vehicle and control method for hydraulic traveling vehicle'20117,659,729'Method and device for measuring width direction end position of stripe body, and method and device for measuring width direction center position of stripe body'20107,114,232'Collimator and spectrophotometer'20066,972,845'Collimator and spectrophotometer'20056,844,930'Spectrophotometer'20056,565,042'Emergency parachute'20036,281,499'Method for analyzing measured value by on-line spectral analyzer'20016,227,702'Method and apparatus for measuring a temperature of a molten metal'20016,034,912'Semiconductor integrated circuit device and method of manufacturing the same'20005,934,521'Hot melt applicator and nozzle used therefor'19995,924,607'Hot melt applicator and nozzle used therefor'19995,898,636'Semiconductor integrated circuit device with interleaved memory and logic blocks'19995,758,940'Liquid crystal Projection display'19985,733,043'Temperature measuring device'19985,649,081'Method and apparatus for pattern data processing'19975,641,357'Apparatus for checking glue application state'19975,589,883'Cathode ray tube display'19965,537,171'Liquid crystal projection display'19965,507,854'Method and apparatus for measuring displacement of molten metal'19965,485,560'Displaying method and system for displaying an object by designating a state of display of the object'19965,438,415'Ellipsometer and method of controlling coating thickness therewith'19955,432,404'Apparatus for detecting a geometric distortion of an image on a display device'19955,398,040'Adaptive crosshatch signal generator'19955,355,187'Liquid crystal projection display'19945,343,450'Timer operation management apparatus'19945,341,049'Integrated circuit having alternate rows of logic cells and I/O cells'19945,337,090'Video output circuit with wide bandwidth and low power consumption for high resolution display'19945,335,066'Measuring method for ellipsometric parameter and ellipsometer'19945,311,285'Measuring method for ellipsometric parameter and ellipsometer'19945,306,948'Semiconductor device and semiconductor module having auxiliary high power supplying terminals'19945,301,021'Display with vertical scanning format transformation'19945,219,794'Semiconductor integrated circuit device and method of fabricating same'19935,213,417'Apparatus for temperature measurement'19935,194,783'Display apparatus based on a digital convergence scheme'19935,189,347'Video circuit for driving a cathode ray tube'19935,088,836'Apparatus for temperature measurement'19925,070,281'Display having automatic correction device for horizontal deflection distortion'19915,067,007'Semiconductor device having leads for mounting to a surface of a printed circuit board'19915,053,724'High precision PLL with circuit for preventing erroneous capture'19915,039,923'Focus adjusting device for projection display'19915,023,524'Grid-drive type display apparatus'19915,010,280'Vertical deflection circuit for CRT display device'19914,980,614'Convergence correction circuit'19904,961,030'Miss convergence compensating device for projection type display'19904,952,850'Horizontal deflection circuit'19904,918,359'Cathode ray tube display device'19904,897,581'Horizontal deflection circuit'19904,814,671'Convergence circuit'19894,647,854'Apparatus for measuring the level of the molten metal in the mold of a continuous casting machine'19874,606,641'Apparatus for measuring film thickness'19864,567,435'Method and apparatus for continuously measuring distance utilizing eddy current and having temperature difference influence elimination'19864,553,854'Method for continuously measuring surface temperature of heated steel strip'19854,544,268'Method and apparatus for detecting flaw on threads of male screw'19854,378,993'Method and apparatus for measuring height level of melting zone in blast furnace'19834,324,665'Process for recovering bromine from waste liquid'19824,186,792'Apparatus for monitoring and controlling the level of the molten metal in the mold of a continuous casting machine'19804,095,469'Temperature measuring apparatus'19784,030,027'Apparatus for non-contact measurement of distance from a metallic body using a detection coil in the feedback circuit of an amplifier'19774,027,978'Method and apparatus for non-contact measurement of a gauge of a high temperature material'19774,024,903'Evaporative cooling method by natural circulation of cooling water'19774,019,131'Method and apparatus for measuring the shape of the wavy edges of metal strips using a detection coil controlled to track the strip edge'19773,997,835'Method and apparatus for measuring distance'19763,995,211'Electromagnetic induction type detectors'19763,970,291'Method of preventing occurrence of pulsation in a circulating liquid for evaporative cooling'1976

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1976–2001Patents assigned to NIPPON KOKAN KK (23)· patent assignee history
1976–2014Based in Yokohama, JP· patent location history
1989–2000Patents assigned to HITACHI LTD (29)· patent assignee history
1991–2015Based in Kanagawa, JP· patent location history
1992–2001Based in Kawasaki, JP· patent location history
1993–2021Based in Tokyo, JP· patent location history
1996–2014Patents assigned to NIRECO CORP (11)· patent assignee history
2011–2020Patents assigned to KOMATSU MFG CO LTD (10)· patent assignee history
2011–2017Based in Komatsu, JP· patent location history
2012–2015Patents assigned to YAMADA TAKEO (4)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD291989–2000
NIPPON KOKAN KK231976–2001
NIRECO CORP111996–2014
KOMATSU MFG CO LTD102011–2020
YAMADA TAKEOself42012–2015
Locations
LocationPatentsSpan
Yokohama, JP431976–2014
Tokyo, JP131993–2021
Komatsu, JP72011–2017
Kanagawa, JP41991–2015
Kawasaki, JP41992–2001