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Inventor

Hung van Pham

Inventor
Santa Clara, CA, US

Overview

1→
Patents
1988
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions100%
PatentTitleYear
4,776,695'High accuracy film thickness measurement system'1988

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1988Patents assigned to PROMETRIX CORP (1)· patent assignee history
1988Based in Santa Clara, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
PROMETRIX CORP11988
Locations
LocationPatentsSpan
Santa Clara, California, US11988