Inventor
Christian Marinus Leewis
Inventor
Maastricht, NL
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices71%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them7%
PatentTitleYear
10,871,716Metrology robustness based on through-wavelength similarity202010,394,132Metrology robustness based on through-wavelength similarity20199,939,735Method of determining focus, inspection apparatus, patterning device, substrate and device manufacturing method20189,594,299'Method of determining focus, inspection apparatus, patterning device, substrate and device manufacturing method'20179,436,099'Lithographic focus and dose measurement using a 2-D target'20168,982,328'Method and apparatus for overlay measurement'20158,891,061'Lithographic focus and dose measurement using a 2-D target'20148,848,195'Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method for determining a property of a substrate'20148,685,626'Method of measuring a characteristic'20148,502,955'Method of determining a characteristic'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013–2020Patents assigned to ASML NETHERLANDS BV (10)· patent assignee history
2013–2015Patents assigned to LEEWIS CHRISTIAN MARINUS (5)· patent assignee history
2013–2015Patents assigned to QUAEDACKERS JOHANNES ANNA (4)· patent assignee history
2013–2015Patents assigned to VANOPPEN PETER CLEMENT PAUL (3)· patent assignee history
2013–2015Patents assigned to MEGENS HENRICUS JOHANNES LAMBERTUS (2)· patent assignee history
2013–2018Based in Maastricht, NL· patent location history
2019–2020Based in Eindhoven, NL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 10 | 2013–2020 |
| LEEWIS CHRISTIAN MARINUSself | 5 | 2013–2015 |
| QUAEDACKERS JOHANNES ANNA | 4 | 2013–2015 |
| VANOPPEN PETER CLEMENT PAUL | 3 | 2013–2015 |
| MEGENS HENRICUS JOHANNES LAMBERTUS | 2 | 2013–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Maastricht, NL | 8 | 2013–2018 |
| Eindhoven, NL | 2 | 2019–2020 |