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Inventor

Eiichi Shinohara

Inventor
Nirasaki, JP

Overview

10→
Patents
2010–2017
Patent span
Physics
Primary field (CPC G)

Patents· 10 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables56%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1019%
H05FStatic electricity13%
H10DInorganic electric semiconductor devices6%
LOC136%
PatentTitleYear
9,759,762'Probe device'20179,658,285'Probe apparatus'20179,638,719'Probe device having cleaning mechanism for cleaning connection conductor'20179,562,942'Probe apparatus'20179,347,970'Probe apparatus'20169,322,844'Probe card for power device'20169,261,553'Probe apparatus'20168,085,052'Charge eliminating apparatus and method, and program storage medium for removing static electricity from a target object such as a wafer'20117,859,279'Charge eliminating apparatus and method, and program storage medium'2010D0609652'Wafer attracting plate'2010

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2010–2017Patents assigned to TOKYO ELECTRON LTD (10)· patent assignee history
2010–2017Based in Nirasaki, JP· patent location history
2011–2017Patents assigned to SHINOHARA EIICHI (4)· patent assignee history
2011Patents assigned to HANAWA KAZUKI (1)· patent assignee history
2016–2017Patents assigned to TAOKA KEN (3)· patent assignee history
2016–2017Patents assigned to OGASAWARA IKUO (2)· patent assignee history
2016–2017Based in Yamanashi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOKYO ELECTRON LTD102010–2017
SHINOHARA EIICHIself42011–2017
TAOKA KEN32016–2017
OGASAWARA IKUO22016–2017
HANAWA KAZUKI12011
Locations
LocationPatentsSpan
Nirasaki, JP62010–2017
Yamanashi, JP42016–2017