Inventor
Isaac Mazor
Inventor
Haifa, IL
Overview
Patents· 41 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties52%
G01BMeasuring length, thickness or similar linear dimensions15%
G01TMeasurement of nuclear or x-radiation8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices3%
H01LSemiconductor devices3%
B28DWorking stone or stone-like materials2%
G01SRadio direction-finding2%
G21KHandling of particles or ionising radiation not otherwise provided for2%
H01JElectric discharge tubes or discharge lamps2%
PatentTitleYear
10,386,313Closed-loop control of X-ray knife edge20199,829,448Measurement of small features using XRF20179,666,322'X-ray source assembly'20179,632,043'Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF'20179,606,073'X-ray scatterometry apparatus'20179,551,677'Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)'20179,389,192'Estimation of XRF intensity from an array of micro-bumps'20169,390,984'X-ray inspection of bumps on a semiconductor substrate'20168,731,138'High-resolution X-ray diffraction measurement with enhanced sensitivity'20148,565,379'Combining X-ray and VUV analysis of thin film layers'20138,243,878'High-resolution X-ray diffraction measurement with enhanced sensitivity'20127,804,934'Accurate measurement of layer dimensions using XRF'20107,653,174'Inspection of small features using X-ray fluorescence'20107,649,978'Automated selection of X-ray reflectometry measurement locations'20107,551,719'Multifunction X-ray analysis system'20097,483,513'Measurement of properties of thin films on sidewalls'20097,481,579'Overlay metrology using X-rays'20097,453,985'Control of X-ray beam spot size'20087,245,695'Detection of dishing and tilting using X-ray fluorescence'20077,231,016'Efficient measurement of diffuse X-ray reflections'20077,120,228'Combined X-ray reflectometer and diffractometer'20067,113,566'Enhancing resolution of X-ray measurements by sample motion'20067,110,491'Measurement of critical dimensions using X-ray diffraction in reflection mode'20067,068,753'Enhancement of X-ray reflectometry by measurement of diffuse reflections'20067,023,954'Optical alignment of X-ray microanalyzers'20066,947,520'Beam centering and angle calibration for X-ray reflectometry'20056,907,108'Dual-wavelength x-ray monochromator'20056,895,071'XRR detector readout processing'20056,680,996'Dual-wavelength X-ray reflectometry'20046,639,968'X-ray reflectometer'20036,556,652'Measurement of critical dimensions using X-rays'20036,512,814'X-ray reflectometer'20036,453,002'Differential measurement of X-ray microfluorescence'20026,389,102'X-ray array detector'20026,381,303'X-ray microanalyzer for thin films'20026,351,516'Detection of voids in semiconductor wafer processing'20026,184,686'Contamination and residuals inspection system'20016,108,398'X-ray microfluorescence analyzer'20005,740,953'Method and apparatus for cleaving semiconductor wafers'19985,438,413'Process for measuring overlay misregistration during semiconductor wafer fabrication'19955,112,129'Method of image enhancement for the coherence probe microscope with applications to integrated circuit metrology'1992Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1992–2019Based in Haifa, IL· patent location history
2000–2009Patents assigned to JORDAN VALLEY APPLIED RADIATION LTD (20)· patent assignee history
2008–2016Patents assigned to JORDAN VALLEY SEMICONDUCTORS (10)· patent assignee history
2012–2014Patents assigned to MAZOR ISAAC (3)· patent assignee history
2016–2019Patents assigned to BRUKER JV ISRAEL LTD (8)· patent assignee history
2017Patents assigned to JORDAN VALLEY SEMICONDUCTORS LTD (5)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| JORDAN VALLEY APPLIED RADIATION LTD | 20 | 2000–2009 |
| JORDAN VALLEY SEMICONDUCTORS | 10 | 2008–2016 |
| BRUKER JV ISRAEL LTD | 8 | 2016–2019 |
| JORDAN VALLEY SEMICONDUCTORS LTD | 5 | 2017 |
| MAZOR ISAACself | 3 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Haifa, IL | 41 | 1992–2019 |