Inventor
Changhyun Lee
Inventor
Suwon-si, KR
Overview
Patents· 66 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Bprimary
H10BElectronic memory devices24%
H10DInorganic electric semiconductor devices23%
H01LSemiconductor devices19%
G11CStatic stores16%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
F16HGearing2%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
Y10TTechnical subjects covered by former us classification2%
B60KArrangement or mounting of propulsion units or of transmissions in vehicles1%
B60TVehicle brake control systems or parts thereof1%
PatentTitleYear
10,839,896Programming multiple-level memory cells with multiple-pass202010,818,357Memory device including multiple select gates and different bias conditions202010,748,929Three-dimensional semiconductor devices202010,600,801Three-dimensional semiconductor memory devices202010,586,808Semiconductor device including a stack having a sidewall with recessed and protruding portions202010,559,590Three-dimensional semiconductor devices202010,517,160Method and apparatus for controlling lighting201910,483,278Nonvolatile memory devices and methods forming the same201910,411,031Semiconductor device including a stack having a sidewall with recessed and protruding portions201910,360,979Memory device including multiple select gates and different bias conditions201910,300,241Method and apparatus for controlling temperature adjustment device201910,176,880Selective body reset operation for three dimensional (3D) NAND memory201910,096,616Three-dimensional semiconductor device with vertical and horizontal channels in stack structure having electrodes vertically stacked on the substrate201810,038,007Three-dimensional semiconductor devices201810,026,480Memory device including multiple select gates and different bias conditions20189,966,451Integrated structures20189,947,686Semiconductor device including a stack having a sidewall with recessed and protruding portions20189,905,574'Three-dimensional semiconductor memory devices'20189,905,575'Integrated structures comprising charge-storage regions along outer portions of vertically-extending channel material'20189,847,346Three-dimensional semiconductor memory device20179,793,292'Three-dimensional semiconductor memory devices'20179,773,882'Integrated structures'20179,754,957'Nonvolatile memory devices and methods forming the same'20179,748,265'Integrated structures comprising charge-storage regions along outer portions of vertically-extending channel material'20179,728,266'Memory device including multiple select gates and different bias conditions'20179,685,452'Three-dimensional semiconductor device with vertical and horizontal channels in stack structure having electrodes vertically stacked on the substrate'20179,627,396'Semiconductor device including a stack having a sidewall with recessed and protruding portions'20179,601,208'Nonvolatile memory device and driving method thereof'20179,595,346'3-Dimensional semiconductor memory device and operating method thereof'20179,564,237'Nonvolatile memory device and read method thereof'20179,536,895'Methods of fabricating three-dimensional semiconductor devices'20179,356,159'Three-dimensional semiconductor memory devices'20169,343,154'Nonvolatile memory device and driving method thereof'20169,240,419'Three-dimensional semiconductor devices and methods of fabricating the same'20169,236,340'String selection structure of three-dimensional semiconductor device'20169,224,485'Nonvolatile memory device and method of programming the same minimizing disturbance from adjacent cells'20159,224,493'Nonvolatile memory device and read method thereof'20159,177,965'Nonvolatile memory device in three-dimensional structure with a stress reducing materials on the channel'20159,147,471'Nonvolatile memory device and driving method thereof'20159,136,395'Three-dimensional semiconductor memory devices'20159,093,479'Method of forming nonvolatile memory device'20159,047,952'Nonvolatile memory devices and methods forming the same'20159,000,508'Nonvolatile memory devices having vertically integrated nonvolatile memory cell sub-strings therein'20158,981,458'Three-dimensional semiconductor devices and methods of fabricating the same'20158,929,145'Nonvolatile memory device, programming method thereof and memory system including the same'20158,919,218'Transmission system for shift by wire'20148,891,315'Nonvolatile memory device and erase method thereof'20148,872,183'Three-dimensional semiconductor devices'20148,839,916'Control method for parking release apparatus of shift-by-wire shifting device'20148,829,589'Three-dimensional semiconductor memory device'20148,737,129'Nonvolatile memory device and read method thereof'20148,653,578'Semiconductor device comprising string structures formed on active region'20148,643,080'Three-dimensional semiconductor memory device'20148,644,064'Memory semiconductor device and method of operating the same'20148,625,348'Nonvolatile memory devices and methods forming the same'20148,581,321'Nonvolatile memory device and method of forming the same'20138,569,827'Three-dimensional semiconductor memory devices'20138,570,805'Nonvolatile memory device, programming method thereof and memory system including the same'20138,546,869'Nonvolatile memory devices having vertically integrated nonvolatile memory cell sub-strings therein'20138,446,773'Memory system and programming method thereof'20138,434,383'Transmission shifting apparatus for vehicle'20138,408,088'Apparatus for removing parking state of shift-by-wire shifting device'20138,278,170'Methods of forming nonvolatile memory devices having vertically integrated nonvolatile memory cell sub-strings therein'20128,107,295'Nonvolatile memory device and read method thereof'20128,064,259'Nonvolatile NAND-type memory devices including charge storage layers connected to insulating layers'20118,059,466'Memory system and programming method thereof'2011Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2011–2020Patents assigned to SAMSUNG ELECTRONICS CO LTD (52)· patent assignee history
2011–2018Patents assigned to LEE CHANGHYUN (31)· patent assignee history
2011–2017Patents assigned to CHOI JUNGDAL (7)· patent assignee history
2011–2020Based in Suwon-si, KR· patent location history
2011–2015Based in Gyeonggi-do, KR· patent location history
2013–2018Patents assigned to SON BYOUNGKEUN (12)· patent assignee history
2013–2014Based in Seoul, KR· patent location history
2013–2015Based in Hwasung, KR· patent location history
2017–2020Patents assigned to MICRON TECHNOLOGY INC (9)· patent assignee history
2017–2020Based in Boise, ID, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 52 | 2011–2020 |
| LEE CHANGHYUNself | 31 | 2011–2018 |
| SON BYOUNGKEUN | 12 | 2013–2018 |
| MICRON TECHNOLOGY INC | 9 | 2017–2020 |
| CHOI JUNGDAL | 7 | 2011–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Suwon-si, KR | 47 | 2011–2020 |
| Boise, ID, US | 10 | 2017–2020 |
| Seoul, KR | 4 | 2013–2014 |
| Gyeonggi-do, KR | 3 | 2011–2015 |
| Hwasung, KR | 2 | 2013–2015 |