Inventor

Isao Nagaoki

Inventor

Hitachinaka, JP

Overview

2002–2018

Patent span

Electricity

Primary field (CPC H)

Patents· 23 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary

H01JElectric discharge tubes or discharge lamps48%

G01NInvestigating or analysing materials by determining their chemical or physical properties24%

G06VImage or video recognition or understanding17%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%

H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy2%

LOC162%

Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution2%

PatentTitleYear

10,083,814Electron microscope and sample observation method2018 9,721,752'Sample holder and charged particle device'2017 8,928,485'Charged corpuscular ray apparatus'2015 8,586,922'Transmission electron microscope and sample observation method'2013 8,426,811'Electron microscope'2013 8,288,725'Charged particle beam device'2012 8,044,352'Electron microscopy'2011 D0636005'Electron microscope'2011 7,838,834'Image forming method and electron microscope'2010 7,838,829'Charged particle beam device'2010 7,544,936'Method and device for observing a specimen in a field of view of an electron microscope'2009 7,214,938'Sample observation method and transmission electron microscope'2007 7,164,129'Method and device for observing a specimen in a field of view of an electron microscope'2007 7,041,977'Electron microscope'2006 7,022,989'Method and device for observing a specimen in a field of view of an electron microscope'2006 7,012,254'Method and device for observing a specimen in a field of view of an electron microscope'2006 6,982,420'Sample observation method and transmission electron microscope'2006 6,888,139'Electron microscope'2005 6,878,934'Method and device for observing a specimen in a field of view of an electron'2005 6,875,983'Electron microscope and means to set observation conditions'2005 6,777,679'Method of observing a sample by a transmission electron microscope'2004 6,570,156'Autoadjusting electron microscope'2003 6,472,663'Electron microscope'2002

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2002–2009Patents assigned to HITACHI LTD (9)· patent assignee history

2002–2015Based in Hitachinaka, JP· patent location history

2004–2018Patents assigned to HITACHI HIGH TECH CORP (13)· patent assignee history

2005–2006Patents assigned to HITACHI SCIENCE SYSTEMS LTD (2)· patent assignee history

2012–2015Patents assigned to NAGAOKI ISAO (4)· patent assignee history

2013Patents assigned to TANIGAKI TOSHIAKI (2)· patent assignee history

2017–2018Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
HITACHI HIGH TECH CORP	13	2004–2018
HITACHI LTD	9	2002–2009
NAGAOKI ISAOself	4	2012–2015
HITACHI SCIENCE SYSTEMS LTD	2	2005–2006
TANIGAKI TOSHIAKI	2	2013

Locations

Location	Patents	Span
Hitachinaka, JP	21	2002–2015
Tokyo, JP	2	2017–2018