Inventor
Frank W. Angelotti
Inventor
Rochester, MN, US
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables88%
G06FElectric digital data processing13%
PatentTitleYear
9,008,196'Updating interface settings for an interface'20156,909,274'Signal pin tester for AC defects in integrated circuits'20056,807,645'Method and apparatus for implementing enhanced LBIST diagnostics of intermittent failures'20046,590,382'Signal pin tester for AC defects in integrated circuits'20035,909,452'Method for avoiding contention during boundary scan testing'19995,757,820'Method for testing interconnections between integrated circuits using a dynamically generated interconnect topology model'19985,717,701'Apparatus and method for testing interconnections between semiconductor devices'19985,617,430'Testing system interconnections using dynamic configuration and test generation'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2015Patents assigned to IBM (8)· patent assignee history
1997–2015Based in Rochester, MN, US· patent location history
2015Patents assigned to ANGELOTTI FRANK W (1)· patent assignee history
2015Patents assigned to CAMPBELL MICHAEL D (1)· patent assignee history
2015Patents assigned to CHRISTIAN KENNETH L (1)· patent assignee history
2015Patents assigned to ECKERT MARTIN (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 8 | 1997–2015 |
| ANGELOTTI FRANK Wself | 1 | 2015 |
| CAMPBELL MICHAEL D | 1 | 2015 |
| CHRISTIAN KENNETH L | 1 | 2015 |
| ECKERT MARTIN | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Rochester, Minnesota, US | 8 | 1997–2015 |