Inventor

YIH WANG

Inventor
TW

Overview

197→
Patents
2021–2026
Patent span
Electricity
Primary field (CPC H)

Patents· 197 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary
G11CStatic stores25%
H10BElectronic memory devices19%
H01LSemiconductor devices16%
H10DInorganic electric semiconductor devices13%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1012%
G06FElectric digital data processing5%
H10NElectric solid-state devices not otherwise provided for3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
H03KPulse technique1%
B82YSpecific uses or applications of nanostructures1%
PatentTitleYear
12,597,466Semiconductor memory devices with differential threshold voltages202612,591,429Memory interface202612,586,619Integrated circuit device and methods202612,575,107Memory device202612,563,721Memory device and method for forming the same202612,562,216Circuit with swept voltage on bit line or bit line bar202612,541,319Computing-in-memory device and method202612,538,851Memory packages and methods of forming same202612,518,841One-time-programmable memory202612,520,4704CPP SRAM cell and array202612,517,679Memory interface202612,489,051One-time-programmable memory device including an antifuse structure and methods of forming the same202512,482,531Dynamic error monitor and repair202512,464,811Memory devices and methods of manufacturing thereof202512,463,151PUF memory devices and methods of manufacturing thereof202512,424,257Memory devices with dual-side access circuits and methods for operating the same202512,423,494Memory device with improved anti-fuse read current202512,406,923One-time-programmable memory device including an antifuse structure and methods of forming the same202512,406,702Switches to reduce routing rails of memory system202512,402,376High-voltage nano-sheet transistor202512,394,469DRAM computation circuit and method202512,388,065Memory circuits202512,389,806MRAM cell and MRAM202512,380,950Non-volatile static random access memory (NVSRAM) with multiple magnetic tunnel junction cells202512,382,714Memory devices and methods of manufacturing thereof202512,374,396Memory including metal rails with balanced loading202512,361,981Using embedded switches for reducing capacitive loading on a memory system202512,355,026Method of writing to or erasing multi-bit memory storage device202512,347,505Memory device and operating method of the same202512,349,423Memory devices and methods of manufacturing thereof202512,322,435Sense amplifier with read circuit for compute-in-memory202512,322,432Method and system for refresh of memory devices202512,293,799Memory circuit and method of operating same202512,288,577Sensing amplifier, method and controller for sensing memory cell202512,283,336System for differentiated thermal throttling of memory and method of operating same202512,284,804Memory devices, semiconductor devices, and methods of operations a memory device202512,272,420Series of parallel sensing operations for multi-level cells202512,266,424Memory circuit and method of operating same202512,260,904Memory device with additional write bit lines202512,260,928Memory devices with backside boost capacitor and methods for forming the same202512,260,897Separated read BL scheme in 3T dram for read speed improvement202512,261,152Vertical interconnect structures in three-dimensional integrated circuits202512,254,923Nonvolatile SRAM202512,249,390Memory systems with vertical integration202512,243,589Memory device and method for operating the same202512,243,618Method of manufacturing semiconductor device202512,230,338Semiconductor memory devices with diode-connected MOS202512,230,359Semiconductor device202512,217,822Memory device with source line control202512,217,790Memory array connections202512,217,782Current steering in reading magnetic tunnel junction202512,218,047Memory devices and methods of manufacturing thereof202512,210,368Bias generating devices and methods for generating bias202512,211,568Multi-fuse memory cell circuit and method202512,205,648Three-dimensional one time programmable memory202512,191,395Dual gate control for trench shaped thin film transistors202512,193,223Memory device with improved anti-fuse read current202512,193,204Memory devices and methods of manufacturing thereof202512,190,986Sense amplifier for coupling effect reduction202512,190,931Semiconductor memory devices and methods of manufacturing thereof202512,183,397Memory circuits and devices, and methods thereof202412,176,284Through plate interconnect for a vertical MIM capacitor202412,176,049MIM eFuse memory devices and fabrication method thereof202412,165,704Memory device with write pulse trimming202412,137,570Three dimensional memory device202412,137,571Integrated circuit including three-dimensional memory device202412,114,506Semiconductor structure and method of fabricating the same202412,112,163Memory interface202412,100,705Deep trench via for three-dimensional integrated circuit202412,094,558Multiple stack high voltage circuit for memory202412,087,345Balanced negative bitline voltage for a write assist circuit202412,087,354Memory device202412,089,414Memory device and method of forming the same202412,089,402Integrated circuit layout and method202412,080,643Integrated circuit structures having differentiated interconnect lines in a same dielectric layer202412,075,614MIM memory cell with backside interconnect structures202412,068,284Vertical interconnect structures with integrated circuits202412,063,786Compute-in-memory device and method202412,063,773Layout structure including anti-fuse cell202412,062,408Switches to reduce routing rails of memory system202412,052,859Non-volatile memory device with reduced area202412,048,147Layout structure including anti-fuse cell202412,027,220One-time-programmable memory202412,026,404Memory device for scheduling maximum number of memory macros write operations at re-arranged time intervals202412,027,204Memory including metal rails with balanced loading202412,014,768DRAM computation circuit and method202412,010,833Method and structure for reduce OTP cell area and leakage202412,002,528Memory device and operating method of the same202412,002,534Memory array word line routing202411,997,847Thin film transistors with spacer controlled gate length202411,997,8434CPP SRAM cell and array202411,984,164Non-volatile static random access memory (nvSRAM) with multiple magnetic tunnel junction cells202411,978,723Vertical interconnect structures in three-dimensional integrated circuits202411,978,509Semiconductor memory devices with differential threshold voltages202411,978,804Recessed thin-channel thin-film transistor202411,963,463MRAM cell and MRAM202411,953,927Bias generating devices and methods for generating bias202411,955,201Memory device202411,955,191Semiconductor memory devices with diode-connected MOS202411,948,972High-voltage nano-sheet transistor202411,942,155Semiconductor memory devices with dielectric fin structures202411,942,177Using embedded switches for reducing capacitive loading on a memory system202411,935,610Dynamic error monitor and repair202411,915,787Integrated circuit device and methods202411,901,035Method of differentiated thermal throttling of memory and system therefor202411,903,188Memory devices, semiconductor devices, and methods of operating a memory device202411,869,971Multi-bit memory storage device202411,862,729Vertical multi-gate thin film transistors202411,862,728Dual gate control for trench shaped thin film transistors202411,854,663Memory circuit and method of operating same202311,855,046Memory packages and methods of forming same202311,856,786Integrated circuit including three-dimensional memory device202311,854,616Memory including metal rails with balanced loading202311,856,762Memory devices and methods of manufacturing thereof202311,849,574Layout structure of storage cell and manufacturing method thereof202311,848,381Methods of operating multi-bit memory storage device202311,842,781Layout structures of memory array and related methods202311,843,054Vertical architecture of thin film transistors202311,837,300Multi-fuse memory cell circuit and method202311,823,769Reducing capacitive loading of memory system based on switches202311,810,611Method and system for refresh of memory devices202311,810,635Sense amplifier for coupling effect reduction202311,791,005Memory circuit and method of operating same202311,776,595Memory device with source line control202311,770,934Semiconductor structure and method of fabricating the same202311,756,591Switches to reduce routing rails of memory system202311,758,711Thin-film transistor embedded dynamic random-access memory with shallow bitline202311,758,715System and method for reducing cell area and current leakage in anti-fuse cell array202311,756,640MIM efuse memory devices and fabrication method thereof202311,749,664Memory circuits202311,742,021Memory device with write pulse trimming202311,735,235Series of parallel sensing operations for multi-level cells202311,735,280Memory device and operating method of the same202311,735,259Read method, write method and memory circuit using the same202311,723,188Replacement metal COB integration process for embedded DRAM202311,714,570Computing-in-memory device and method202311,705,177Semiconductor memory devices and methods of manufacturing thereof202311,696,437Integrated circuit device202311,690,215Self-aligned bitline and capacitor via formation202311,688,481Semiconductor memory devices with diode-connected MOS202311,681,468Memory device for scheduling maximum number of memory macros write operations at re-arranged time intervals202311,682,433Multiple stack high voltage circuit for memory202311,676,641Memory systems with vertical integration202311,676,648Current steering in reading magnetic tunnel junction202311,657,873Non-volatile static random access memory (nvSRAM) with multiple magnetic tunnel junction cells202311,653,4874F2 DRAM cell using vertical thin film transistor202311,653,492Memory devices and methods of manufacturing thereof202311,631,440Sensing amplifier, method and controller for sensing memory cell202311,605,639One-time-programmable memory device including an antifuse structure and methods of forming the same202311,605,427Memory device with write pulse trimming202311,600,626Semiconductor device including anti-fuse cell202311,601,117Sense amplifier for coupling effect reduction202311,563,014Memory devices and methods of manufacturing thereof202311,563,015Memory devices and methods of manufacturing thereof202311,545,218Nonvolatile SRAM202311,532,746Multi-bit memory storage device and method of operating same202211,532,752Non-volatile memory device with reduced area202211,532,351Memory device with additional write bit lines202211,521,663Memory circuit and method of operating same202211,482,276System and method for read speed improvement in 3T DRAM202211,469,268Damascene-based approaches for embedding spin hall MTJ devices into a logic processor and the resulting structures202211,450,362Memory device, integrated circuit device and method202211,437,386System and method for reducing cell area and current leakage in anti-fuse cell array202211,423,960Memory device202211,424,233Memory circuits and related methods202211,410,740Multi-fuse memory cell circuit and method202211,404,091Memory array word line routing202211,404,536Thin-film transistor structures with gas spacer202211,393,873Approaches for embedding spin hall MTJ devices into a logic processor and the resulting structures202211,386,936Memory device, sensing amplifier, and method for sensing memory cell202211,380,415Dynamic error monitor and repair202211,373,999Deep trench via for three-dimensional integrated circuit202211,367,482Read method, write method and memory circuit using the same202211,342,341Integrated circuit layout, method, structure, and system202211,329,047Thin-film transistor embedded dynamic random-access memory with shallow bitline202211,322,680MRAM cell, MRAM and IC with MRAM202211,322,504Ferroelectric-capacitor integration using novel multi-metal-level interconnect with replaced dielectric for ultra-dense embedded SRAM in state-of-the-art CMOS technology202211,315,936Memory device and manufacturing method thereof202211,309,005Current steering in reading magnetic tunnel junction202211,309,011Method and system for refresh of memory devices202211,296,229Vertical thin film transistors having self-aligned contacts202211,296,087Thin film transistors with spacer controlled gate length202211,282,816Memory packages and methods of forming same202211,270,998Embedded memory in three-dimensional integrated circuit202211,257,827Layout structure including anti-fuse cell202211,250,923Layout structures of memory array202211,245,038Vertical multi-gate thin film transistors202211,238,904Using embedded switches for reducing capacitive loading on a memory system202211,237,834Memory device, access controller thereof and method for accessing memory device202211,238,906Series of parallel sensing operations for multi-level cells202211,233,040Integration of high density cross-point memory and CMOS logic for high density low latency eNVM and eDRAM applications202211,222,895Embedded memory employing self-aligned top-gated thin film transistors202211,200,924Method of minimizing read-disturb-write effect of SRAM circuit and SRAM circuit thereof202111,195,567Balanced negative bitline voltage for a write assist circuit202111,189,356One-time-programmable memory202111,183,261Test device for memory, method for detecting hardware failure in memory device, and test apparatus of memory array202111,183,594Dual gate control for trench shaped thin film transistors2021

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2021–2026Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (170)· patent assignee history
2021–2025Patents assigned to INTEL CORP (26)· patent assignee history
2021–2026Based in TW· patent location history
2021–2025Based in US· patent location history
2023Patents assigned to TAIWAN SEMICONDUCTOR MFG LIMITED (1)· patent assignee history
2026Patents assigned to TAIWAN SEMICONDUCTOR MFG COMPANY LTD (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TAIWAN SEMICONDUCTOR MFG CO LTD1702021–2026
INTEL CORP262021–2025
TAIWAN SEMICONDUCTOR MFG COMPANY LTD12026
TAIWAN SEMICONDUCTOR MFG LIMITED12023
Locations
LocationPatentsSpan
TW1712021–2026
US262021–2025