Inventor
ARMIN GRUNDMANN
Inventor
DE
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables40%
G01MTesting static or dynamic balance of machines or structures10%
G02BOptical elements, systems or apparatus10%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light10%
H04BTransmission10%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation10%
H10HInorganic light-emitting semiconductor devices having potential barriers10%
PatentTitleYear
12,210,057Wafer-level test method for optoelectronic chips202512,203,983Contacting module for contacting optoelectronic chips202511,906,579Wafer-level test method for optoelectronic chips202411,480,495Position-tolerance-insensitive contacting module for contacting optoelectronic chips2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to JENOPTIK OPTICAL SYS GMBH (4)· patent assignee history
2022–2025Based in DE· patent location history
2024Patents assigned to JENOPTIK JENA GMBH (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| JENOPTIK OPTICAL SYS GMBH | 4 | 2022–2025 |
| JENOPTIK JENA GMBH | 1 | 2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| DE | 4 | 2022–2025 |