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Inventor

Masami Ooyama

Inventor
Hitachi, JP

Overview

4→
Patents
2011–2013
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
G01BMeasuring length, thickness or similar linear dimensions25%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1025%
PatentTitleYear
8,537,351'Inspection apparatus and inspection method'20138,395,766'Foreign matter inspection apparatus'20138,203,705'Inspection apparatus and inspection method'20127,898,653'Foreign matter inspection apparatus'2011

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2011–2013Patents assigned to HITACHI HIGH TECH CORP (4)· patent assignee history
2011–2013Based in Hitachi, JP· patent location history
2012–2013Patents assigned to OOYAMA MASAMI (3)· patent assignee history
2012–2013Patents assigned to NAGASAKI KEIICHI (2)· patent assignee history
2012–2013Patents assigned to ZAMA KAZUHIRO (2)· patent assignee history
2013Patents assigned to HACHIYA KIMIKO (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP42011–2013
OOYAMA MASAMIself32012–2013
NAGASAKI KEIICHI22012–2013
ZAMA KAZUHIRO22012–2013
HACHIYA KIMIKO12013
Locations
LocationPatentsSpan
Hitachi, JP42011–2013