Inventor
Dieter Graefe
Inventor
Jena, DE
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties40%
G02BOptical elements, systems or apparatus40%
B01LChemical or physical laboratory apparatus for general use10%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices10%
PatentTitleYear
7,488,924'Method for determining the focal position during imaging of a sample using an inclined position receiving device'20097,270,431'Illumination device and its use'20076,946,664'Specimen slides and methods and uses thereof'20056,483,588'Arrangement for detecting biomolecular reactions and interactions'20026,040,907'Microscope system for the detection of emission distribution and process for operation of the same'20006,018,388'Microtiter plate'20005,999,262'Process and apparatus for detecting structural changes of specimens'19995,712,705'Arrangement for analysis of substances at the surface of an optical sensor'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2007Patents assigned to ZEISS CARL JENA GMBH (6)· patent assignee history
1998Patents assigned to HOFFMAN LA ROCHE F (1)· patent assignee history
1998Patents assigned to SCHOTT GLASWERKE (1)· patent assignee history
1998–2009Based in Jena, DE· patent location history
2009Patents assigned to ZEISS CARL MICROIMAGING GMBH (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS CARL JENA GMBH | 6 | 1998–2007 |
| HOFFMAN LA ROCHE F | 1 | 1998 |
| SCHOTT GLASWERKE | 1 | 1998 |
| ZEISS CARL MICROIMAGING GMBH | 1 | 2009 |
Locations
| Location | Patents | Span |
|---|---|---|
| Jena, DE | 8 | 1998–2009 |