Inventor
Sun Mo An
Inventor
Daejeon, KR
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores42%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy16%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution13%
G01RMeasuring electric variables6%
B60LPropulsion of electrically-propelled vehicles3%
H01HElectric switches3%
H02JElectric power networks3%
H03KPulse technique3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
Y02PClimate change mitigation technologies in the production or processing of goods3%
PatentTitleYear
10,753,975Apparatus for diagnosing relay failure of battery using parallel circuit for constant power supply and method thereof202010,530,020Cartridge with mount frame having lead mounting board and lower and upper sliding boards and battery module having same202010,056,600Battery pack20189,935,346Battery module20189,412,993'Battery module equipped with sensing modules having improved coupling structure'20169,368,237'Semiconductor integrated circuit capable of controlling test modes without stopping test'20168,542,548'Semiconductor memory device and thermal code output circuit capable of correctly measuring thermal codes'20138,391,100'Semiconductor memory apparatus'20138,259,527'Self-refresh test circuit of semiconductor memory apparatus'20128,248,874'Semiconductor memory apparatus and probe test control circuit therefor'20128,023,347'Anti-fuse repair control circuit and semiconductor device including DRAM having the same'20117,940,115'Fuse circuit for semiconductor integrated circuit and control method of the same'20117,940,585'Multi-column decoder stress test circuit'20117,920,437'Address control circuit of semiconductor memory apparatus'20117,864,613'Thermal code transmission circuit and semiconductor memory device using the same'20117,800,964'Wafer burn-in test circuit'20107,688,663'Anti-fuse repair control circuit and semiconductor device including DRAM having the same'20107,368,953'Buffer'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2016Patents assigned to HYNIX SEMICONDUCTOR INC (11)· patent assignee history
2010–2016Based in Gyeonggi-do, KR· patent location history
2010–2011Based in Ichon-shi, KR· patent location history
2011–2013Based in Icheon-si, KR· patent location history
2012–2016Patents assigned to AN SUN MO (5)· patent assignee history
2012–2013Patents assigned to SK HYNIX INC (2)· patent assignee history
2013Based in Seongnam-si, KR· patent location history
2016–2020Patents assigned to LG CHEMICAL LTD (5)· patent assignee history
2016Patents assigned to CHU SHIN HO (1)· patent assignee history
2016–2020Based in Daejeon, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HYNIX SEMICONDUCTOR INC | 11 | 2008–2016 |
| AN SUN MOself | 5 | 2012–2016 |
| LG CHEMICAL LTD | 5 | 2016–2020 |
| SK HYNIX INC | 2 | 2012–2013 |
| CHU SHIN HO | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Daejeon, KR | 5 | 2016–2020 |
| Gyeonggi-do, KR | 5 | 2010–2016 |
| Ichon-shi, KR | 3 | 2010–2011 |
| Icheon-si, KR | 2 | 2011–2013 |
| Seongnam-si, KR | 1 | 2013 |