Inventor
Yonatan OREN
Inventor
IL
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties30%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light15%
G01BMeasuring length, thickness or similar linear dimensions14%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
H01LSemiconductor devices9%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure8%
PatentTitleYear
12,467,869Raman spectroscopy based measurement system202512,392,733Combined ocd and photoreflectance method and system202512,372,473Accurate Raman spectroscopy202512,366,533Hybrid metrology method and system202512,359,968Systems and methods for optical metrology202512,298,182Optical technique for material characterization202512,163,892Accurate Raman spectroscopy202412,152,993Accurate Raman spectroscopy202412,066,385Raman spectroscopy based measurements in patterned structures202412,025,560Hybrid metrology method and system202411,927,481Optical technique for material characterization202411,906,434Raman spectroscopy based measurement system202411,860,104Accurate raman spectroscopy202411,802,829Method and system for broadband photoreflectance spectroscopy202311,740,183Accurate Raman spectroscopy202311,543,294Optical technique for material characterization202311,415,519Accurate Raman spectroscopy202211,293,871Raman spectroscopy based measurement system202211,275,027Raman spectroscopy based measurements in patterned structures202211,150,190Hybrid metrology method and system2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2025Patents assigned to NOVA LTD (20)· patent assignee history
2021–2025Based in IL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NOVA LTD | 20 | 2021–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| IL | 20 | 2021–2025 |