Inventor
William J. Parrish
Inventor
Santa Barbara, CA, US
Overview
Patents· 44 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Nprimary
H04NPictorial communication, e.g. television27%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light18%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation8%
G06TImage data processing or generation, in general7%
G01RMeasuring electric variables5%
G11CStatic stores5%
H10DInorganic electric semiconductor devices4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
G06FElectric digital data processing2%
H01GCapacitors2%
PatentTitleYear
10,976,202Wafer level processed microbolometer focal plane array202110,890,490Thermography process for converting signal to temperature in a thermal imaging system202110,867,371Fixed pattern noise mitigation for a thermal imaging system202010,605,668Thermography process for converting signal to temperature in a thermal imaging system202010,600,164Image adjustment based on locally flat scenes202010,467,736Image adjustment based on locally flat scenes201910,437,024Method of producing an optical element2019D0846781Combination flashlight and camera201910,230,912Fixed pattern noise mitigation for a thermal imaging system201910,186,020Local contrast adjustment for digital images201910,128,808Gain calibration for an imaging system201810,075,658Data digitization and display for an imaging system20189,947,086Image adjustment based on locally flat scenes20189,930,324'Time based offset correction for imaging systems'20189,924,116'Time based offset correction for imaging systems and adaptive calibration control'20189,797,942'Radiometric test and configuration of an infrared focal plane array at wafer probe'20179,798,220'Shutter for an infrared camera'20179,727,954'Local contrast adjustment for digital images'20179,595,934'Gain calibration for an imaging system'20177,752,742'Infrared camera packaging'20107,709,793'Bolometer array compensation'20107,470,904'Infrared camera packaging'20087,470,902'Infrared camera electronic architectures'20087,034,301'Microbolometer focal plane array systems and methods'20067,015,715'Hybrid gap measurement circuit'20066,812,465'Microbolometer focal plane array methods and circuitry'20046,803,555'Two-stage auto-zero amplifier circuit for electro-optical arrays'20046,593,562'Electro-optical sensor arrays with reduced sensitivity to defects'20036,550,665'Method for electrically interconnecting large contact arrays using eutectic alloy bumping'20036,521,967'Three color quantum well infrared photodetector focal plane array'20036,344,651'Differential current mode output circuit for electro-optical sensor arrays'20026,316,777'Constant power snapshot microemitter array with integral digital interface, isolated substrate current return, and linearized signal response'20016,133,596'Near complete charge transfer device'20006,028,309'Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array'20005,756,999'Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array'19985,084,704'Focal plane analog-to-digital converter'19925,053,700'Method for wafer scale testing of redundant integrated circuit dies'19915,039,879'Digitally programmable gain normalization circuit'19914,956,602'Wafer scale testing of redundant integrated circuit dies'19904,633,086'Input circuit for infrared detector'19864,479,139'Charge coupled device open circuit image detector'19844,380,056'Charge coupled device focal plane with serial register having interdigitated electrodes'19834,371,885'Charge coupled device improved meander channel serial register'19834,331,889'Charge coupled device focal plane integrater'1982Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1982–1983Patents assigned to HUGHES AIRCRAFT CO (3)· patent assignee history
1982–2021Based in Santa Barbara, CA, US· patent location history
1986–1992Patents assigned to GRUMMAN AEROSPACE CORP (3)· patent assignee history
1986Based in Hope Ranch, CA, US· patent location history
1991–2000Based in Goleta, CA, US· patent location history
1998–2006Patents assigned to INDIGO SYSTEMS CORP (11)· patent assignee history
2008–2010Patents assigned to FLIR SYSTEMS (3)· patent assignee history
2017–2021Patents assigned to SEEK THERMAL INC (19)· patent assignee history
2017Based in Santa Monica, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SEEK THERMAL INC | 19 | 2017–2021 |
| INDIGO SYSTEMS CORP | 11 | 1998–2006 |
| FLIR SYSTEMS | 3 | 2008–2010 |
| GRUMMAN AEROSPACE CORP | 3 | 1986–1992 |
| HUGHES AIRCRAFT CO | 3 | 1982–1983 |
Locations
| Location | Patents | Span |
|---|---|---|
| Santa Barbara, California, US | 39 | 1982–2021 |
| Goleta, California, US | 3 | 1991–2000 |
| Santa Monica, California, US | 1 | 2017 |
| Hope Ranch, California, US | 1 | 1986 |