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Inventor

Jay M. Amos

Inventor
Hobe Sound, FL, US

Overview

5→
Patents
1993–2015
Patent span
Physics
Primary field (CPC G)

Patents· 5 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
G01BMeasuring length, thickness or similar linear dimensions33%
B82YSpecific uses or applications of nanostructures17%
PatentTitleYear
9,194,687'System and method for measuring non-conductive coating thickness using eddy currents'20157,126,123'Surface contamination detection method and apparatus'20066,229,872'Method and apparatus for use in inspection of objects'20016,040,695'Method and apparatus for inspection of components'20005,207,005'Floating head probe'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2001Patents assigned to UNITED TECHNOLOGIES CORP (3)· patent assignee history
1993–2001Based in Hobe Sound, FL, US· patent location history
2006Patents assigned to CESSNA AIRCRAFT CO (1)· patent assignee history
2006–2015Based in Wichita, KS, US· patent location history
2015Patents assigned to AMOS JAY M (1)· patent assignee history
2015Patents assigned to TEXTRON INNOVATIONS INC (1)· patent assignee history
2015Patents assigned to YU FENG (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
UNITED TECHNOLOGIES CORP31993–2001
AMOS JAY Mself12015
CESSNA AIRCRAFT CO12006
TEXTRON INNOVATIONS INC12015
YU FENG12015
Locations
LocationPatentsSpan
Hobe Sound, Florida, US31993–2001
Wichita, KS, US22006–2015