Inventor
Hirokatsu Niijima
Inventor
Tokyo, JP
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables62%
G11CStatic stores23%
H03KPulse technique8%
H04LTransmission of digital information, e.g. telegraphic communication8%
PatentTitleYear
8,014,969'Test apparatus, test method and manufacturing method'20117,447,955'Test apparatus and test method'20087,409,615'Test apparatus and test method'20087,262,627'Measuring apparatus, measuring method, and test apparatus'20077,197,682'Semiconductor test device and timing measurement method'20077,100,099'Test apparatus'20067,002,334'Jitter measuring apparatus and a testing apparatus'20066,768,954'Jitter quantity calculator and tester'20045,955,907'Temperature compensation circuit and method for providing a constant delay'19995,732,047'Timing comparator circuit for use in device testing apparatus'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2011Patents assigned to ADVANTEST CORP (10)· patent assignee history
1998–1999Based in Gyoda, JP· patent location history
2004–2011Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANTEST CORP | 10 | 1998–2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 8 | 2004–2011 |
| Gyoda, JP | 2 | 1998–1999 |