Inventor
Tomonori Goto
Inventor
Sapporo, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions59%
G06TImage data processing or generation, in general11%
G01DMeasuring not specially adapted for a specific variable7%
G05BControl or regulating systems in general7%
B61FRail vehicle suspensions, e.g. underframes, bogies or arrangements of wheel axles4%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure4%
G01PMeasuring linear or angular speed, acceleration, deceleration, or shock4%
G06FElectric digital data processing4%
PatentTitleYear
10,627,221Measurement method and measurement program20209,921,059'Measurement value correction method, computer-readable recording medium, and measurement device'20189,631,915'Arm type three-dimensional measuring machine and inclination correction method of base part for supporting arm type three-dimensional measuring machine'20179,423,415'Sensor state determination system'20169,366,592'Arm type three-dimensional measuring apparatus and deflection correction method in arm type three-dimensional measuring apparatus'20168,681,341'Shape measuring method and shape measuring apparatus'20148,520,216'Shape measuring apparatus'20138,521,470'Form measuring device and method of aligning form data'20138,504,316'Form measuring instrument, and calibration method and calibration program therefor'20138,290,740'Form measuring instrument, form measuring method, and program'20127,542,872'Form measuring instrument, form measuring method and form measuring program'20097,539,586'Correction method and measuring instrument'20097,461,112'Signal processor, signal processing method, signal processing program, recording medium with the signal processing program recorded therein and measuring instrument'20087,383,143'Correction method, computer-readable recording medium storing computer-executable correction programs and measurement apparatus'20087,366,637'Form measuring instrument'20087,188,054'Signal processing method, signal processing program, recording medium storing the signal processing program and signal processor'20076,885,980'Signal-processing method, signal-processing program, recording medium, storing the signal-processing program and signal processor'20056,701,266'Measurement data fairing method'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2020Patents assigned to MITUTOYO CORP (17)· patent assignee history
2004–2017Based in Sapporo, JP· patent location history
2012–2016Patents assigned to GOTO TOMONORI (6)· patent assignee history
2012–2013Patents assigned to TAMAI TOSHIYUKI (2)· patent assignee history
2013–2014Patents assigned to MIYAKURA JYOTA (3)· patent assignee history
2014Patents assigned to ASANO HIDEMITSU (1)· patent assignee history
2016Based in Nagoya, JP· patent location history
2018–2020Based in Hokkaido, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITUTOYO CORP | 17 | 2004–2020 |
| GOTO TOMONORIself | 6 | 2012–2016 |
| MIYAKURA JYOTA | 3 | 2013–2014 |
| TAMAI TOSHIYUKI | 2 | 2012–2013 |
| ASANO HIDEMITSU | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sapporo, JP | 15 | 2004–2017 |
| Hokkaido, JP | 2 | 2018–2020 |
| Nagoya, JP | 1 | 2016 |