Inventor

Naohiro Kamijo

Inventor

Kanagawa, JP

Overview

2004–2018

Patent span

Physics

Primary field (CPC G)

Patents· 17 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Jprimary

G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light42%

H04NPictorial communication, e.g. television21%

G01NInvestigating or analysing materials by determining their chemical or physical properties12%

G03GElectrography6%

B41FPrinting machines or presses3%

G01BMeasuring length, thickness or similar linear dimensions3%

G02BOptical elements, systems or apparatus3%

G06KGraphical data reading3%

G06TImage data processing or generation, in general3%

H10DInorganic electric semiconductor devices3%

PatentTitleYear

9,958,265Specimen measuring device and computer program product2018 9,677,938'Spectral characteristic acquisition device, image evaluation device, and image formation apparatus'2017 9,355,466'Image processing apparatus, image processing system, image processing method, and storage medium'2016 9,224,080'Spectral characteristic acquisition device, image evaluation device, and image formation apparatus'2015 9,222,833'Spectral characteristic obtaining apparatus, image evaluation apparatus and image forming apparatus'2015 9,197,761'Spectral characteristic acquisition apparatus, image evaluation apparatus, and image forming apparatus'2015 9,068,893'Spectral characteristic obtaining apparatus, image evaluation apparatus and image forming apparatus'2015 8,964,176'Spectrometer, and image evaluating unit and image forming device incorporating the same'2015 8,908,176'Apparatus and method for obtaining spectral characteristics'2014 8,879,057'Spectral characteristic acquiring apparatus, spectral characteristic acquiring method and image evaluating apparatus'2014 8,755,046'Spectrometer, and image evaluating unit and image forming device incorporating the same'2014 8,593,628'Spectral characteristics estimation device, image forming apparatus having the same, and spectral characteristics estimation method'2013 8,559,005'Spectral characteristic measuring device and image forming apparatus'2013 8,497,988'Spectral distribution measuring device'2013 8,472,019'Spectroscopic characteristics acquisition unit, image evaluation unit, and image forming apparatus'2013 8,363,217'Spectrometric measurement apparatus, image evaluation apparatus, and image forming apparatus'2013 6,744,037'METHOD FOR MEASURING SCAN BEAM LIGHT QUANTITY DISTRIBUTION IN SCAN OPTICAL SYSTEM, MEASUREMENT APPARATUS THEREOF, MEASUREMENT EVALUATION APPARATUS THEREOF, AND IMAGE FORMATION APPARATUS USING THE MEASUREMENT EVALUATION APPARATUS'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004Based in Tokyo, JP· patent location history

2013–2018Patents assigned to KAMIJO NAOHIRO (16)· patent assignee history

2013–2018Patents assigned to RICOH CO LTD (16)· patent assignee history

2013–2017Patents assigned to SHIMBO KOHEI (14)· patent assignee history

2013–2015Patents assigned to SEO MANABU (11)· patent assignee history

2013–2017Patents assigned to KUBOTA YOICHI (10)· patent assignee history

2013–2018Based in Kanagawa, JP· patent location history

2013Based in Atsugi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
KAMIJO NAOHIROself	16	2013–2018
RICOH CO LTD	16	2013–2018
SHIMBO KOHEI	14	2013–2017
SEO MANABU	11	2013–2015
KUBOTA YOICHI	10	2013–2017

Locations

Location	Patents	Span
Kanagawa, JP	15	2013–2018
Atsugi, JP	1	2013
Tokyo, JP	1	2004