Inventor
Kinya Yamashita
Inventor
Tokyo, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables36%
H01LSemiconductor devices19%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1019%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
B29CShaping or joining of plastics2%
B29LIndexing scheme associated with subclass b29c, relating to particular articles2%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form2%
F28FDetails of heat-exchange and heat-transfer apparatus, of general application2%
G01BMeasuring length, thickness or similar linear dimensions2%
G05BControl or regulating systems in general2%
PatentTitleYear
10,539,607Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon202010,436,833Evaluation apparatus and evaluation method201910,228,412Semiconductor device and method for testing same201910,192,797Semiconductor device and electrical contact structure thereof20199,720,014'Semiconductor evaluation apparatus and semiconductor evaluation method'20179,678,143'Semiconductor evaluation apparatus'20179,551,745'Semiconductor device assessment apparatus'20179,347,988'Semiconductor testing jig and semiconductor testing method performed by using the same'20169,335,371'Semiconductor evaluating device and semiconductor evaluating method'20169,312,160'Wafer suction method, wafer suction stage, and wafer suction system'20169,257,316'Semiconductor testing jig and transfer jig for the same'20169,207,257'Inspection apparatus'20159,188,624'Inspection apparatus'20159,157,931'Probe card'20159,117,880'Method for manufacturing semiconductor device'20158,980,655'Test apparatus and test method'20158,981,805'Inspection apparatus and inspection method'20156,675,876'Rotary cooling roller'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004Patents assigned to SASAKURA ENG CO LTD (1)· patent assignee history
2004Based in Osaka, JP· patent location history
2015–2020Patents assigned to MITSUBISHI ELECTRIC CORP (17)· patent assignee history
2015–2016Patents assigned to AKIYAMA HAJIME (6)· patent assignee history
2015–2016Patents assigned to OKADA AKIRA (6)· patent assignee history
2015–2016Patents assigned to YAMASHITA KINYA (6)· patent assignee history
2015–2020Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITSUBISHI ELECTRIC CORP | 17 | 2015–2020 |
| AKIYAMA HAJIME | 6 | 2015–2016 |
| OKADA AKIRA | 6 | 2015–2016 |
| YAMASHITA KINYAself | 6 | 2015–2016 |
| SASAKURA ENG CO LTD | 1 | 2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 17 | 2015–2020 |
| Osaka, JP | 1 | 2004 |