Inventor
Kathryn A. Bassin
Inventor
Harpursville, NY, US
Overview
Patents· 29 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing53%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes39%
A61BDiagnosis4%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data4%
PatentTitleYear
10,372,593System and method for resource modeling and simulation in test planning201910,235,269System and method to produce business case metrics based on defect analysis starter (DAS) results201910,185,649System and method for efficient creation and reconciliation of macro and micro level test plans20199,753,838'System and method to classify automated code inspection services defect output for defect analysis'20179,710,257'System and method to map defect reduction data to organizational maturity profiles for defect projection modeling'20179,594,671'System and method for resource modeling and simulation in test planning'20179,558,464'System and method to determine defect risks in software solutions'20179,442,821'System and method to classify automated code inspection services defect output for defect analysis'20169,292,421'System and method for resource modeling and simulation in test planning'20169,262,736'System and method for efficient creation and reconciliation of macro and micro level test plans'20169,176,844'System and method to classify automated code inspection services defect output for defect analysis'20159,052,981'System and method to map defect reduction data to organizational maturity profiles for defect projection modeling'20158,924,936'System and method to classify automated code inspection services defect output for defect analysis'20148,893,086'System and method for resource modeling and simulation in test planning'20148,689,188'System and method for analyzing alternatives in test plans'20148,667,458'System and method to produce business case metrics based on code inspection service results'20148,645,921'System and method to determine defect risks in software solutions'20148,635,056'System and method for system integration test (SIT) planning'20148,578,341'System and method to map defect reduction data to organizational maturity profiles for defect projection modeling'20138,566,805'System and method to provide continuous calibration estimation and improvement options across a software integration life cycle'20138,539,438'System and method for efficient creation and reconciliation of macro and micro level test plans'20138,527,955'System and method to classify automated code inspection services defect output for defect analysis'20138,495,583'System and method to determine defect risks in software solutions'20138,352,237'System and method for system integration test (SIT) planning'20137,917,897'Defect resolution methodology and target assessment process with a software system'20117,831,868'Process for software support resource allocation based on analysis of categorized field problems'20107,765,436'Process for software support resource allocation based on analysis of categorized field problems'20107,757,125'Defect resolution methodology and data defects quality/risk metric model extension'20107,669,180'Method and apparatus for automated risk assessment in software projects'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2019Patents assigned to IBM (29)· patent assignee history
2010–2019Based in Harpursville, NY, US· patent location history
2013–2019Patents assigned to BASSIN KATHRYN A (11)· patent assignee history
2013–2019Patents assigned to KAGAN STEVEN (11)· patent assignee history
2013–2019Patents assigned to SKRABANEK SUSAN E (11)· patent assignee history
2013–2019Patents assigned to LI SHAO C (9)· patent assignee history
2013–2019Based in Endicott, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 29 | 2010–2019 |
| BASSIN KATHRYN Aself | 11 | 2013–2019 |
| KAGAN STEVEN | 11 | 2013–2019 |
| SKRABANEK SUSAN E | 11 | 2013–2019 |
| LI SHAO C | 9 | 2013–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Harpursville, New York, US | 18 | 2010–2019 |
| Endicott, New York, US | 11 | 2013–2019 |