Inventor
Hiromi Inada
Inventor
Hitachinaka, JP
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps49%
G01NInvestigating or analysing materials by determining their chemical or physical properties22%
G06VImage or video recognition or understanding14%
G06TImage data processing or generation, in general5%
B01DSeparation3%
B28BShaping clay or other ceramic compositions3%
C04BLime, magnesia3%
G01MTesting static or dynamic balance of machines or structures3%
PatentTitleYear
9,709,457'Method of detecting defects in honeycomb structural body'20179,305,745'Scanning electron microscope'20168,878,130'Scanning electron microscope and scanning transmission electron microscope'20148,710,438'Scanning transmission electron microscope and axial adjustment method thereof'20148,304,722'Charged particle beam equipment and charged particle microscopy'20127,923,701'Charged particle beam equipment'20117,649,172'Charged particle beam equipment with magnification correction'20107,633,064'Electric charged particle beam microscopy and electric charged particle beam microscope'20097,544,936'Method and device for observing a specimen in a field of view of an electron microscope'20097,435,957'Charged particle beam equipment and charged particle microscopy'2008D0571385'Electron microscope'20087,375,330'Charged particle beam equipment'20087,372,047'Charged particle system and a method for measuring image magnification'20087,372,051'Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system'20087,164,129'Method and device for observing a specimen in a field of view of an electron microscope'20077,126,120'Electron microscope'20067,112,294'Method of producing ceramic body'20067,022,989'Method and device for observing a specimen in a field of view of an electron microscope'20067,012,254'Method and device for observing a specimen in a field of view of an electron microscope'20066,878,934'Method and device for observing a specimen in a field of view of an electron'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2009Patents assigned to HITACHI LTD (5)· patent assignee history
2005–2014Based in Hitachinaka, JP· patent location history
2006–2016Patents assigned to HITACHI HIGH TECH CORP (13)· patent assignee history
2006–2017Patents assigned to DENSO CORP (2)· patent assignee history
2006Based in Kariya, Aichi-pref., JP· patent location history
2009Based in Pleasanton, CA, US· patent location history
2012–2014Patents assigned to INADA HIROMI (3)· patent assignee history
2014Patents assigned to NAKAMURA KUNIYASU (2)· patent assignee history
2014–2016Based in Tokyo, JP· patent location history
2017Based in Tsu, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 13 | 2006–2016 |
| HITACHI LTD | 5 | 2005–2009 |
| INADA HIROMIself | 3 | 2012–2014 |
| DENSO CORP | 2 | 2006–2017 |
| NAKAMURA KUNIYASU | 2 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hitachinaka, JP | 15 | 2005–2014 |
| Tokyo, JP | 2 | 2014–2016 |
| Tsu, JP | 1 | 2017 |
| Pleasanton, California, US | 1 | 2009 |
| Kariya, Aichi-pref., JP | 1 | 2006 |