Inventor

Martin J. Koxxy

Inventor

Hillsboro, OR, US

Overview

1993–2013

Patent span

Electricity

Primary field (CPC H)

Patents· 24 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables33%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1016%

A46DManufacture of brushes13%

H01RElectrically-conductive connections13%

H05KPrinted circuits13%

Y10TTechnical subjects covered by former us classification13%

PatentTitleYear

8,451,017'Membrane probing method using improved contact'2013 7,761,986'Membrane probing method using improved contact'2010 7,681,312'Membrane probing system'2010 7,595,632'Wafer probe station having environment control enclosure'2009 7,403,025'Membrane probing system'2008 7,400,155'Membrane probing system'2008 7,348,787'Wafer probe station having environment control enclosure'2008 7,266,889'Membrane probing system'2007 7,148,711'Membrane probing system'2006 7,009,383'Wafer probe station having environment control enclosure'2006 6,930,498'Membrane probing system'2005 6,860,009'Probe construction using a recess'2005 6,838,890'Membrane probing system'2005 6,825,677'Membrane probing system'2004 6,801,047'Wafer probe station having environment control enclosure'2004 6,708,386'Method for probing an electrical device having a layer of oxide thereon'2004 6,636,059'Wafer probe station having environment control enclosure'2003 6,486,687'Wafer probe station having environment control enclosure'2002 6,380,751'Wafer probe station having environment control enclosure'2002 6,313,649'Wafer probe station having environment control enclosure'2001 6,256,882'Membrane probing system'2001 5,604,444'Wafer probe station having environment control enclosure'1997 5,532,609'Wafer probe station having environment control enclosure'1996 5,266,889'Wafer probe station with integrated environment control enclosure'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2013Patents assigned to CASCADE MICROTECH INC (24)· patent assignee history

1993–2013Based in Hillsboro, OR, US· patent location history

2013Patents assigned to BAYNE MICHAEL A (1)· patent assignee history

2013Patents assigned to GLEASON K REED (1)· patent assignee history

2013Patents assigned to KOXXY MARTIN (1)· patent assignee history

2013Patents assigned to LESHER TIMOTHY (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
CASCADE MICROTECH INC	24	1993–2013
BAYNE MICHAEL A	1	2013
GLEASON K REED	1	2013
KOXXY MARTINself	1	2013
LESHER TIMOTHY	1	2013

Locations

Location	Patents	Span
Hillsboro, OR, US	24	1993–2013