Inventor
Peter Fazekas
Inventor
Bayport, NY, US
Overview
Patents· 33 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Kprimary
G06KGraphical data reading36%
G01RMeasuring electric variables14%
H01JElectric discharge tubes or discharge lamps7%
B82YSpecific uses or applications of nanostructures5%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light5%
G02BOptical elements, systems or apparatus4%
H02PControl or regulation of electric motors, electric generators or dynamo-electric converters4%
H05BElectric heating4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
B01FMixing, e.g. dissolving, emulsifying or dispersing2%
PatentTitleYear
11,105,898Adaptive illumination system for 3D-time of flight sensor202110,803,269Scan module and reader for, and method of, electro-optically reading a target by adjusting reading parameters based on target distance202010,760,959Apparatus for and method of electro-optically reading a target in the presence of ambient light by detecting and suppressing the ambient light20209,524,410'Method and system for optimizing system settings of a laser scanner control system'20169,403,134'Method for producing a material mixture of powder or granular state material and liquid'20169,016,578'Apparatus for and method of electro-optically reading a target in the presence of ambient light by suppressing the ambient light'20158,967,478'Apparatus for and method of electro-optically reading a target in the presence of ambient light by rejecting the ambient light'20158,971,366'Killswitch arrangement for and method of regulating laser output power in electro-optical readers'20158,925,814'Apparatus for and method of monitoring output power of a laser beam during reading of targets'20158,861,059'Method and apparatus for controlling mirror motion in light scanning arrangements'20148,820,645'Method and system for optimizing system settings of a laser scanner control system'20148,733,659'Arrangement for and method of regulating laser output power in electro-optical readers'20148,220,713'Illumination driver circuit for using in imaging-based barcode reader'20128,154,783'Method and apparatus for controlling mirror motion in light scanning arrangements'20127,609,193'Method and system for a configurable communications interface'2009RE040101'Electro-optical scanner having selectable scan pattern'20087,128,264'Electro-optical reader with improved performance in high intensity ambient light'20066,257,491'Packaged mirror including mirror travel stops'20016,059,188'Packaged mirror including mirror travel stops'20006,036,094'Hand-held optical scanner for reading two-dimensional bar code symbols and the like'20005,988,502'Electro-optical scanner having selectable scan pattern'19995,635,700'Bar code scanner with multi-channel light collection'19975,530,233'Bar code scanner with quasi-retroreflective light collection'19964,860,225'Method and apparatus for storing measured data from sub-regions of a sputter crater which is generated and analyzed in a secondary ion mass spectrometer'19894,721,855'Method and apparatus for rapid measurements of electrical signals at circuit nodes of integrated circuits in which noise signals are also detected'19884,686,455'Method for the localization of time-critical events within a clock electronic circuit'19874,686,466'Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof'19874,675,602'Method for automatically setting an operating point given signal curve measurements with a particle beam measuring apparatus'19874,642,566'Method for the registration and representation of signals in the interior of integrated circuits by considering edge steepness and apparatus for implementing the method'19874,634,972'Method for measuring low-frequency signal progressions with an electron probe inside integrated circuits'19874,611,119'Method of emphasizing a subject area in a scanning microscope'19864,477,775'Method and apparatus for a fast internal logic check of integrated circuits'19844,471,302'Method for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probe'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984–1989Patents assigned to SIEMENS AG (10)· patent assignee history
1984–1989Based in Munich, DE· patent location history
1996–2016Patents assigned to SYMBOL TECHNOLOGIES INC (19)· patent assignee history
1996–2001Based in Medford, NY, US· patent location history
2000–2021Based in Bayport, NY, US· patent location history
2008Based in Baypoint, NY, US· patent location history
2012–2014Patents assigned to FAZEKAS PETER (5)· patent assignee history
2012–2014Patents assigned to GIEBEL JAMES (5)· patent assignee history
2016–2021Patents assigned to SYMBOL TECHNOLOGIES LLC (4)· patent assignee history
2016Based in Budapest, HU· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SYMBOL TECHNOLOGIES INC | 19 | 1996–2016 |
| SIEMENS AG | 10 | 1984–1989 |
| FAZEKAS PETERself | 5 | 2012–2014 |
| GIEBEL JAMES | 5 | 2012–2014 |
| SYMBOL TECHNOLOGIES LLC | 4 | 2016–2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Bayport, New York, US | 16 | 2000–2021 |
| Munich, DE | 10 | 1984–1989 |
| Medford, New York, US | 5 | 1996–2001 |
| Budapest, HU | 1 | 2016 |
| Baypoint, New York, US | 1 | 2008 |