Inventor
Harsh Sinha
Inventor
Santa Clara, CA, US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties20%
H01JElectric discharge tubes or discharge lamps20%
G06FElectric digital data processing10%
G06KGraphical data reading10%
G06TImage data processing or generation, in general10%
G06VImage or video recognition or understanding10%
H01LSemiconductor devices10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
PatentTitleYear
10,770,258Method and system for edge-of-wafer inspection and review202010,056,224Method and system for edge-of-wafer inspection and review20189,922,269'Method and system for iterative defect classification'20189,898,811'Method and system for defect classification'20189,696,268'Automated decision-based energy-dispersive x-ray methodology and apparatus'20179,318,395'Systems and methods for preparation of samples for sub-surface defect review'2016Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2016–2020Patents assigned to KLA TENCOR CORP (6)· patent assignee history
2016–2020Based in Santa Clara, CA, US· patent location history
2017Based in Milpitas, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 6 | 2016–2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Santa Clara, California, US | 5 | 2016–2020 |
| Milpitas, California, US | 1 | 2017 |