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Inventor

Itaru Kitajima

Inventor
Chiba, JP

Overview

5→
Patents
2006–2013
Patent span
Physics
Primary field (CPC G)

Patents· 5 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Qprimary
G01QScanning-probe techniques or apparatus50%
B82YSpecific uses or applications of nanostructures10%
C01BNon-metallic elements10%
D01FChemical features in the manufacture of artificial filaments, threads, fibres, bristles or ribbons10%
F21KNon-electric light sources using luminescence10%
G09BEducational or demonstration appliances10%
PatentTitleYear
8,495,759'Probe aligning method for probe microscope and probe microscope operated by the same'20137,476,418'Method for fabricating nanometer-scale structure'20097,375,322'Cantilever holder and scanning probe microscope'20087,373,806'Scanning probe microscope and scanning method'20087,026,607'Scanning probe microscope'2006

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2006–2013Patents assigned to SII NANOTECHNOLOGY INC (5)· patent assignee history
2006–2013Based in Chiba, JP· patent location history
2013Patents assigned to KITAJIMA ITARU (1)· patent assignee history
2013Patents assigned to SHIKAKURA YOSHITERU (1)· patent assignee history
2013Patents assigned to WAKIYAMA SHIGERU (1)· patent assignee history
2013Patents assigned to YAMAMOTO HIROYOSHI (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SII NANOTECHNOLOGY INC52006–2013
KITAJIMA ITARUself12013
SHIKAKURA YOSHITERU12013
WAKIYAMA SHIGERU12013
YAMAMOTO HIROYOSHI12013
Locations
LocationPatentsSpan
Chiba, JP52006–2013