Inventor
Daniel N. Maynard
Inventor
Craftsbury Common, VT, US
Overview
Patents· 33 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing41%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation12%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices10%
G06TImage data processing or generation, in general7%
H04NPictorial communication, e.g. television7%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
Y02PClimate change mitigation technologies in the production or processing of goods7%
G01RMeasuring electric variables2%
H10DInorganic electric semiconductor devices2%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
PatentTitleYear
8,704,325'Pixel sensors of multiple pixel size and methods of implant dose control'20148,405,751'Image sensor pixel structure employing a shared floating diffusion'20138,334,195'Pixel sensors of multiple pixel size and methods of implant dose control'20128,201,132'System and method for testing pattern sensitive algorithms for semiconductor design'20128,136,066'Apparatus and computer program product for semiconductor yield estimation'20127,893,468'Optical sensor including stacked photodiodes'20117,883,916'Optical sensor including stacked photosensitive diodes'20117,818,694'IC layout optimization to improve yield'20107,752,580'Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique'20107,752,589'Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design'20107,703,061'IC design modeling allowing dimension-dependent rule checking'20107,685,544'Testing pattern sensitive algorithms for semiconductor design'20107,661,081'Content based yield prediction of VLSI designs'20107,584,077'Physical design characterization system'20097,577,927'IC design modeling allowing dimension-dependent rule checking'20097,555,735'IC design modeling allowing dimension-dependent rule checking'20097,552,417'System for search and analysis of systematic defects in integrated circuits'20097,503,020'IC layout optimization to improve yield'20097,415,695'System for search and analysis of systematic defects in integrated circuits'20087,404,164'IC design modeling allowing dimension-dependent rule checking'20087,404,174'method for generating a set of test patterns for an optical proximity correction algorithm'20087,398,485'Yield optimization in router for systematic defects'20087,389,480'Content based yield prediction of VLSI designs'20087,353,472'System and method for testing pattern sensitive algorithms for semiconductor design'20087,284,230'System for search and analysis of systematic defects in integrated circuits'20077,076,749'Method and system for improving integrated circuit manufacturing productivity'20066,823,496'Physical design characterization system'20046,738,954'Method for prediction random defect yields of integrated circuits with accuracy and computation time controls'20046,394,638'Trench isolation for active areas and first level conductors'20026,063,687'Formation of trench isolation for active areas and first level conductors'20006,021,267'Aspect ratio program for optimizing semiconductor chip shape'20005,734,192'Trench isolation for active areas and first level conductors'19985,636,133'Efficient generation of fill shapes for chips and packages'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2014Patents assigned to IBM (33)· patent assignee history
1997Based in Orleans, VT, US· patent location history
1998–2012Based in Craftsbury Common, VT, US· patent location history
2009–2014Based in Craftsbury, VT, US· patent location history
2012–2014Patents assigned to MAYNARD DANIEL N (4)· patent assignee history
2012–2014Patents assigned to RASSEL RICHARD J (3)· patent assignee history
2012–2014Patents assigned to ELLIS-MONAGHAN JOHN J (2)· patent assignee history
2012–2013Patents assigned to HIBBELER JASON D (2)· patent assignee history
2013Based in Essex Junction, VT, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 33 | 1997–2014 |
| MAYNARD DANIEL Nself | 4 | 2012–2014 |
| RASSEL RICHARD J | 3 | 2012–2014 |
| ELLIS-MONAGHAN JOHN J | 2 | 2012–2014 |
| HIBBELER JASON D | 2 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Craftsbury Common, VT, US | 28 | 1998–2012 |
| Craftsbury, VT, US | 3 | 2009–2014 |
| Essex Junction, VT, US | 1 | 2013 |
| Orleans, VT, US | 1 | 1997 |