Inventor

Christopher T. Cotton

Inventor
Honeoye Falls, NY, US

Overview

19→
Patents
1996–2021
Patent span
Physics
Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G02Bprimary
G02BOptical elements, systems or apparatus24%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them12%
H04NPictorial communication, e.g. television12%
G01CMeasuring distances, levels or bearings6%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light6%
A61BDiagnosis3%
F16KValves3%
G01BMeasuring length, thickness or similar linear dimensions3%
G01DMeasuring not specially adapted for a specific variable3%

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1996–2016Based in Honeoye Falls, NY, US· patent location history
1999–2000Patents assigned to LEICA MICROSYSTEMS INC (2)· patent assignee history
2002–2009Patents assigned to SCRAM TECHNOLOGIES INC (6)· patent assignee history
2009–2010Patents assigned to GOODRICH CORP (2)· patent assignee history
2009Based in Mendon, NY, US· patent location history
2010–2014Patents assigned to COTTON CHRISTOPHER T (3)· patent assignee history
2010–2013Patents assigned to ASE OPTICS INC (2)· patent assignee history
2021Based in Cypress, TX, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SCRAM TECHNOLOGIES INC62002–2009
COTTON CHRISTOPHER Tself32010–2014
ASE OPTICS INC22010–2013
GOODRICH CORP22009–2010
LEICA MICROSYSTEMS INC21999–2000
Locations
LocationPatentsSpan
Honeoye Falls, New York, US171996–2016
Cypress, Texas, US12021
Mendon, New York, US12009