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Inventor

Hiroshi Yamaji

Inventor
Kawasaki, JP

Overview

18→
Patents
1977–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 18 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H05Kprimary
H05KPrinted circuits18%
B01DSeparation9%
B01FMixing, e.g. dissolving, emulsifying or dispersing9%
G01BMeasuring length, thickness or similar linear dimensions6%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G02BOptical elements, systems or apparatus6%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests6%
Y10TTechnical subjects covered by former us classification6%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry3%
PatentTitleYear
11,001,565Glycolide production method202110,463,984Evaporator201910,434,437Evaporation device20197,846,303'Multi-structure internal heat exchange type distillation tower'20107,097,394'Circuit board production method and circuit board production data'20066,341,889'Method for distributing liquid by controlling rotation speed of a shaft as a function of the liquid depth in a tank'20025,711,587'Cover mounting structure for shelf assembly'19985,602,723'Subrack device'19975,398,748'Heat pipe connector and electronic apparatus and radiating fins having such connector'19955,273,463'Test connector for electronic circuit units'19935,262,922'Heat radiation structure for semiconductor device'19935,253,320'Optical fiber cable lead-in structure'19934,823,235'Earth connection device in metal core printed circuit board'19894,747,734'Profiling apparatus'19884,626,101'Surface defect inspecting apparatus'19864,583,861'Surface condition judging apparatus'19864,567,364'Method and apparatus for measuring dimension of secondary electron emission object'19864,053,989'Co-ordinates measuring apparatus for an exclusive propeller processing machine'1977

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1977–1988Patents assigned to MITSUBISHI HEAVY IND LTD (2)· patent assignee history
1977–1988Based in Hiroshima, JP· patent location history
1986Patents assigned to TOKYO SHIBAURA ELECTRIC CO (2)· patent assignee history
1986Based in Yokohama, JP· patent location history
1989–1998Patents assigned to FUJITSU LTD (7)· patent assignee history
1989–1997Based in Kawasaki, JP· patent location history
2010Patents assigned to KANSAI CHEM ENG (1)· patent assignee history
2010–2019Based in Amagasaki, JP· patent location history
2019Patents assigned to KANSAI CHEMICAL ENG CO LTD (2)· patent assignee history
2021Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJITSU LTD71989–1998
KANSAI CHEMICAL ENG CO LTD22019
MITSUBISHI HEAVY IND LTD21977–1988
TOKYO SHIBAURA ELECTRIC CO21986
KANSAI CHEM ENG12010
Locations
LocationPatentsSpan
Kawasaki, JP61989–1997
Amagasaki, JP22010–2019
Hiroshima, JP21977–1988
Yokohama, JP21986
Tokyo, JP12021