Inventor
Ikeda Hiroki
Inventor
JP
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables38%
H10NElectric solid-state devices not otherwise provided for18%
F28FDetails of heat-exchange and heat-transfer apparatus, of general application15%
H01LSemiconductor devices15%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1015%
PatentTitleYear
12,540,968Wafer scale active thermal interposer for device testing202612,540,967Wafer scale active thermal interposer for device testing202612,535,522Wafer scale active thermal interposer for device testing202612,320,841Wafer scale active thermal interposer for device testing202512,235,314Parallel test cell with self actuated sockets202512,216,154Active thermal interposer device202511,940,487Thermal solution for massively parallel testing202411,846,669Active thermal interposer device202311,774,492Test system including active thermal interposer device202311,754,620DUT placement and handling for active thermal interposer device202311,674,999Wafer scale active thermal interposer for device testing202311,609,266Active thermal interposer device202311,567,119Testing system including active thermal interposer device2023Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2023–2026Patents assigned to ADVANTEST TEST SOLUTIONS INC (13)· patent assignee history
2023–2025Based in JP· patent location history
2024–2026Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANTEST TEST SOLUTIONS INC | 13 | 2023–2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 8 | 2023–2025 |
| US | 5 | 2024–2026 |