Inventor
Eric Cordes
Inventor
München, DE
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores60%
G01RMeasuring electric variables20%
G01TMeasurement of nuclear or x-radiation20%
PatentTitleYear
7,277,338'Method and device for testing semiconductor memory devices'20077,260,671'Information containing means for memory modules and memory chips'20077,099,585'Memory circuit with an optical input'20066,426,640'Semiconductor module for burn-in test configuration'20026,423,972'Method for determining neutron spectra and device for carrying out the method'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2007Patents assigned to INFINEON TECHNOLOGIES AG (4)· patent assignee history
2002Patents assigned to GSF FORSCHUNGSZENTRUM UMWELT (1)· patent assignee history
2002Based in Mchen, DE· patent location history
2002Based in Mnchen, DE· patent location history
2006–2007Based in München, DE· patent location history
2007Based in Chapel Hill, NC, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INFINEON TECHNOLOGIES AG | 4 | 2002–2007 |
| GSF FORSCHUNGSZENTRUM UMWELT | 1 | 2002 |
Locations
| Location | Patents | Span |
|---|---|---|
| München, DE | 2 | 2006–2007 |
| Chapel Hill, NC, US | 1 | 2007 |
| Mchen, DE | 1 | 2002 |
| Mnchen, DE | 1 | 2002 |