Inventor
Mark M. Meyers
Inventor
Hamlin, NY, US
Overview
Patents· 66 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus39%
H04NPictorial communication, e.g. television7%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light5%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
B41JTypewriters3%
F21KNon-electric light sources using luminescence3%
F21YIndexing scheme associated with subclasses f21k, f21l, f21s and f21v, relating to the form or the kind of the light sources or of the colour of the light emitted3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them3%
A61BDiagnosis2%
PatentTitleYear
10,697,331Valve actuating mechanism having combined bearing and hydraulic lash adjuster retention device202010,578,274Lens array assembly and method for making the same202010,443,812Vehicle navigational system201910,223,505Secured medicines dispensing device201910,132,743Fixed optics photo-thermal spectroscopy reader and method of use201810,033,910Synchronous sampling methods for infrared cameras20189,933,607Microscope objective20189,689,795'Methods and systems to analyze a gas-mixture'20179,658,385'Lighting system with improved illumination distribution'20179,046,225'Lighting system with improved illumination distribution'20159,007,689'Method and apparatus for forming multiple images'20158,743,368'Optical sensor system and method of sensing'20148,276,379'Systems and apparatus relating to solar-thermal power generation'20127,885,011'Objective for optical imaging systems'20117,692,867'Enhanced parfocality'20107,690,811'System for improved backlight illumination uniformity'20107,442,871'Photovoltaic modules for solar concentrator'2008D0540628'Tofu press'20077,123,165'Apparatus and method for monitoring the output of a warning or indicator light'20066,920,168'Optical assembly'20056,859,324'Optical demultiplexer/multiplexer architecture'20056,785,033'Optical attenuating device and method of manufacture therefor'20046,724,784'Optical wavelength locker module having a high thermal conductive material'2004RE038447'Stand alone photofinishing apparatus'20046,650,916'Method and apparatus for providing high contrast imaging'20036,469,843'Optical bench assembly and fabrication method'20026,438,396'Method and apparatus for providing high contrast imaging'20026,141,048'Compact image capture device'20006,137,535'Compact digital camera with segmented fields of view'20005,894,326'Electronic camera having a printer'19995,859,715'Diffractive laser scanner'19995,825,556'Zoom lens'19985,822,125'Lenslet array system'19985,812,322'Lenslet array system incorporating a field lenslet array'19985,801,889'Technique to eliminate scattered light in diffractive optical elements'19985,799,216'Scene intensity measuring and illumination source detection apparatus'19985,796,522'Lenslet array system with a baffle structure and a shutter'19985,751,492'Diffractive/Refractive lenslet array incorporating a second aspheric surface'19985,742,431'Catadioptric lens system incorporating diffractive achromatization'19985,731,899'Lenslet array system incorporating an integral field lens/reimager lenslet array'19985,731,914'Zoom lens'19985,726,810'Compact zoom lens'19985,715,096'Zoom lens'19985,715,091'Hybrid refractive/diffractive achromatic camera lens'19985,715,090'Color corrected viewfinder including a negative power lens component having a diffractive surface'19985,703,351'Autofocus module having a diffractively achromatized toroidal lens'19975,701,005'Color separating diffractive optical array and image sensor'19975,699,143'Method and apparatus for writing onto a photosensitive material using a modulated light beam'19975,696,371'Diffractive/refractive lenslet array'19975,682,266'Blur filter for eliminating aliasing in electrically sampled images'19975,664,253'Stand alone photofinishing apparatus'19975,638,212'Method of manufacturing a diffractive surface profile'19975,612,172'Method and apparatus for writing onto a photosensitive material using a modulated light beam'19975,589,983'Method of manufacturing a diffractive surface profile'19965,581,405'Hybrid refractive/diffractive achromatic camera lens and camera using such'19965,569,904'Multispot autofocus system having a radiation emitter which emits radiation that is divided into a plurality of discrete beams'19965,557,315'Digital printer using a modulated white light exposure source'19965,543,966'Hybrid refractive/diffractive achromatic camera lens'19965,500,702'Device for identifying a perimeter of a scene to be recorded by an image recording apparatus'19965,485,235'Pointing system for correctly aiming an image recording apparatus towards a human subject'19965,471,046'Camera auto-focusing system with designator using a volume holographic element'19955,164,955'Laser diode with volume refractive index grating'19925,070,509'Surface emitting, low threshold (SELTH) laser diode'19915,049,936'Electrophotographic copier/duplicator having dual imaging apparatus'19915,039,183'Holographic laser scanner'19915,018,808'Method and apparatus for beam displacement in a light beam scanner'1991Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991–2004Patents assigned to EASTMAN KODAK CO (40)· patent assignee history
1991–2000Based in Hamlin, NY, US· patent location history
2002–2005Based in Allentown, PA, US· patent location history
2004–2005Patents assigned to AGERE SYSTEMS INC (3)· patent assignee history
2006–2020Patents assigned to GEN ELECTRIC (16)· patent assignee history
2007–2019Patents assigned to MEYERS MARK (2)· patent assignee history
2010–2018Based in Mechanicville, NY, US· patent location history
2011–2020Based in Niskayuna, NY, US· patent location history
2014–2015Patents assigned to MEYERS MARK MARSHALL (2)· patent assignee history
2015–2018Based in Mechanicsville, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| EASTMAN KODAK CO | 40 | 1991–2004 |
| GEN ELECTRIC | 16 | 2006–2020 |
| AGERE SYSTEMS INC | 3 | 2004–2005 |
| MEYERS MARKself | 2 | 2007–2019 |
| MEYERS MARK MARSHALLself | 2 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hamlin, New York, US | 37 | 1991–2000 |
| Mechanicville, New York, US | 9 | 2010–2018 |
| Allentown, Pennsylvania, US | 5 | 2002–2005 |
| Niskayuna, New York, US | 3 | 2011–2020 |
| Mechanicsville, New York, US | 2 | 2015–2018 |