Inventor
Kevin George Harding
Inventor
Niskayuna, NY, US
Overview
Patents· 92 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions23%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
G02BOptical elements, systems or apparatus10%
G06TImage data processing or generation, in general6%
G06VImage or video recognition or understanding4%
B22FWorking metallic powder4%
B33YAdditive manufacturing, i.e. manufacturing of three-dimensional [3d] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3d printing, stereolithography or selective laser sintering4%
Y02PClimate change mitigation technologies in the production or processing of goods4%
B29CShaping or joining of plastics3%
H04NPictorial communication, e.g. television3%
PatentTitleYear
11,125,551Light modulation for inspection probes202110,906,132Scan strategies for efficient utilization of laser arrays in direct metal laser melting (DMLM)202110,814,427Systems and methods for additive manufacturing in-build assessment and correction of laser pointing accuracy202010,773,336Imaging devices for use with additive manufacturing systems and methods of monitoring and inspecting additive manufacturing components202010,724,940System for monitoring and controlling equipment life due to corrosion degradation202010,674,101Imaging devices for use with additive manufacturing systems and methods of imaging a build layer202010,589,508Additive manufacturing systems and methods202010,583,530System and methods for fabricating a component with laser array202010,500,832Systems and methods for additive manufacturing rotating build platforms201910,399,179Additive manufacturing systems and methods201910,192,298System and method for monitoring tape ends of a composite layup machine201910,054,434Surface roughness measurement device20189,970,753System and method of measuring geometric characteristics of object20189,874,728Long working distance lens system, assembly, and method20189,760,986'Method and system for automated shaped cooling hole measurement'20179,612,211'Methods and systems for enhanced tip-tracking and navigation of visual inspection devices'20179,587,933'System and method for inspecting an object'20179,536,127'Apparatus and method for contactless high resolution handprint capture'20179,342,728'System and method for contactless multi-fingerprint collection'20169,338,363'Method and system for magnification correction from multiple focus planes'20169,207,154'Method and system for creep measurement'20159,188,543'Inspection device and method thereof'20159,148,632'Multi-resolution optical system and method of fabricating same'20159,069,181'Optical imaging system and method, and aperture stop assembly and aperture element'20159,025,067'Apparatus and method for image super-resolution using integral shifting optics'20159,007,689'Method and apparatus for forming multiple images'20158,976,363'System aspects for a probe system that utilizes structured-light'20158,971,588'Apparatus and method for contactless high resolution handprint capture'20158,797,395'Optical system for inspecting porous substrates'20148,743,196'System and method for performing an external inspection on a wind turbine rotor blade'20148,737,756'System and method for depth from defocus imaging'20148,643,849'Measurement systems and methods'20148,600,123'System and method for contactless multi-fingerprint collection'20138,508,589'Imaging systems and associated methods thereof'20138,482,594'Multi-resolution optical system and method of fabricating same'20138,406,487'Method and system for contactless fingerprint detection and verification'20138,340,456'System and method for depth from defocus imaging'20128,112,172'Method and system for gash parameter extraction of a cutting tool'20128,107,083'System aspects for a probe system that utilizes structured-light'20128,045,181'Inspection system and method with multi-image phase shift analysis'20117,969,583'System and method to determine an object distance from a reference point to a point on the object surface'20117,924,439'Method and system for parameter extraction of a cutting tool'20117,925,075'Inspection system and methods with autocompensation for edge break gauging orientation'20117,912,572'Calibration assembly for an inspection system'20117,898,651'Methods and apparatus for inspecting an object'20117,876,454'Method and system for measurement of a cutting tool'20117,821,649'Fringe projection system and method for a probe suitable for phase-shift analysis'20107,812,968'Fringe projection system and method for a probe using a coherent fiber bundle'20107,768,655'Methods and system for measuring an object'20107,626,170'Pyroelectric detection systems and methods of making the same'20097,595,894'Profilometry apparatus and method of operation'20097,577,491'System and method for extracting parameters of a cutting tool'20097,576,347'Method and apparatus for optically inspecting an object using a light source'20097,499,830'Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined part'20097,492,450'Methods and apparatus for inspecting an object'20097,489,408'Optical edge break gage'20097,466,426'Phase shifting imaging module and method of imaging'20087,435,986'System and method for detecting repeating defects in a light-management film'20087,428,055'Interferometer-based real time early fouling detection system and method'20087,428,205'Multi-layer holographic data reading method'20087,365,862'Methods and apparatus for inspecting an object'20087,336,374'Methods and apparatus for generating a mask'20087,327,473'Flatness tester for optical components'20087,302,109'Method and system for image processing for structured light profiling of a part'20077,301,165'Methods and apparatus for inspecting an object'20077,285,767'Methods and apparatus for inspecting an object'20077,199,386'System and method for detecting defects in a light-management film'20077,187,436'Multi-resolution inspection system and method of operating same'20077,099,017'Methods and apparatus for measuring flow opening areas'20067,092,094'Coordinated polarization for shiny surface measurement'20067,015,473'Method and apparatus for internal feature reconstruction'20066,970,590'Side lit, 3D edge location method'20056,930,763'Three dimensional sensor laser noise reduction method'20056,874,932'Methods for determining the depth of defects'20056,795,201'Method of objectively evaluating a surface mark'20046,701,615'Inspection and sorting system and method for part repair'20046,700,668'Method of measuring a part with a wide range of surface reflectivities'20046,678,057'Method and device for reduction in noise in images from shiny parts'20046,466,843'Method and apparatus for lifting objects'20026,084,712'Three dimensional imaging using a refractive optic design'20005,933,231'Method and system for measuring cavities and probe for use therein'19995,835,218'Moire interferometry system and method with extended imaging depth'19985,815,272'Filter for laser gaging system'19985,367,378'Highlighted panel inspection'19945,307,152'Moire inspection system'19945,189,493'Moire contouring camera'19935,069,549'Moire contouring camera'19914,983,043'High accuracy structured light profiler'19914,880,991'Non-contact dimensional gage for turned parts'19894,875,777'Off-axis high accuracy structured light profiler'19894,566,757'Holographic optical processing method and apparatus'19864,478,481'Production of diffraction limited holographic images'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984–1986Based in Dayton, OH, US· patent location history
1989–1999Patents assigned to IND TECHNOLOGY INST (8)· patent assignee history
1989–1999Based in Ann Arbor, MI, US· patent location history
2000Based in Niskuyana, NY, US· patent location history
2002–2021Patents assigned to GEN ELECTRIC (76)· patent assignee history
2002–2021Based in Niskayuna, NY, US· patent location history
2007–2011Based in Nishkayuna, NY, US· patent location history
2012–2015Patents assigned to HARDING KEVIN GEORGE (14)· patent assignee history
2012–2015Patents assigned to ABRAMOVICH GIL (8)· patent assignee history
2012–2015Patents assigned to SONG GUIJU (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 76 | 2002–2021 |
| HARDING KEVIN GEORGEself | 14 | 2012–2015 |
| ABRAMOVICH GIL | 8 | 2012–2015 |
| IND TECHNOLOGY INST | 8 | 1989–1999 |
| SONG GUIJU | 4 | 2012–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 72 | 2002–2021 |
| Ann Arbor, MI, US | 10 | 1989–1999 |
| Nishkayuna, New York, US | 7 | 2007–2011 |
| Dayton, OH, US | 2 | 1984–1986 |
| Niskuyana, New York, US | 1 | 2000 |