Inventor
John R. M. Viertl
Inventor
Niskayuna, NY, US
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
G01BMeasuring length, thickness or similar linear dimensions13%
F16KValves6%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure6%
G01MTesting static or dynamic balance of machines or structures6%
B82YSpecific uses or applications of nanostructures3%
F03DWind motors3%
G01DMeasuring not specially adapted for a specific variable3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%
G01RMeasuring electric variables3%
PatentTitleYear
8,314,611'Magnetic particle inspection apparatus and method'20127,805,998'Apparatus and method for inspection of turbine valve seats'20107,535,565'System and method for detecting and analyzing compositions'20097,440,097'Laser plasma spectroscopy apparatus and method for in situ depth profiling'20087,303,373'Wind turbine systems, monitoring systems and processes for monitoring stress in a wind turbine blade'20077,064,825'Methods and apparatus for evaluating rotary machinery'20066,952,094'Nondestructive inspection method and system therefor'20056,698,288'Method and system for assembling and nondestructive testing of assemblies with composite components'20046,288,537'Eddy current probe with foil sensor mounted on flexible probe tip and method of use'20015,963,882'Ultrasonic pulser/receiver for ultrasonic test equipment'19995,544,953'Rolling-ball thermoelectric potential probe and housing for nondestructive testing of metallic and semiconductor objects'19965,430,376'Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects'19955,334,934'Eddy current probe apparatus and interlaced scanning method for interior inspection of metal devices'19945,329,230'Carriage for eddy current probe having contact ball engagement between carriage and translation means'19944,920,319'Method and apparatus for determining the thickness of a coating on a metal substrate'19904,706,020'High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material'19874,593,245'Eddy current method for detecting a flaw in semi-conductive material'19864,249,423'Semi-nondestructive residual stress measurement'19814,086,809'Acoustic non-intrusive method for check of the set point of a spring-loaded mechanical device'1978Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1978–2012Patents assigned to GEN ELECTRIC (19)· patent assignee history
1978–1990Based in Schenectady, NY, US· patent location history
1994–2012Based in Niskayuna, NY, US· patent location history
2012Patents assigned to BAGGETT GRADY (1)· patent assignee history
2012Patents assigned to MATHAI MANU (1)· patent assignee history
2012Patents assigned to VIERTL JOHN RUEDIGER MADER (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 19 | 1978–2012 |
| BAGGETT GRADY | 1 | 2012 |
| MATHAI MANU | 1 | 2012 |
| VIERTL JOHN RUEDIGER MADERself | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 14 | 1994–2012 |
| Schenectady, New York, US | 5 | 1978–1990 |