Inventor
James W. LeBlanc
Inventor
Niskayuna, NY, US
Overview
Patents· 35 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis44%
G01TMeasurement of nuclear or x-radiation33%
G06TImage data processing or generation, in general5%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G21KHandling of particles or ionising radiation not otherwise provided for4%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
C09KMaterials for miscellaneous applications, not provided for elsewhere2%
G01VGeophysics2%
PatentTitleYear
9,204,852'Systems and methods for increased energy separation in multi-energy X-ray imaging'20158,155,263'Apparatus and method for voltage modulation in X-ray computed tomography'20128,055,039'System and method to obtain noise mitigated monochromatic representation for varying energy level'20117,929,659'System and method for generating computed tomography images'20117,826,587'System and method of fast kVp switching for dual energy CT'20107,813,474'Method and apparatus for performing dual-spectrum CT with fast KV modulation at multiple-view intervals'20107,801,264'Method for calibrating a dual -spectral computed tomography (CT) system'20107,756,239'Diagnostic imaging two non K-edge basis materials plus N K-edge contrast agents'20107,724,865'System and method of optimizing a monochromatic representation of basis material decomposed CT images'20107,697,659'Direct conversion energy discriminating CT detector with over-ranging correction'20107,634,060'Direct conversion energy discriminating CT detector with over-ranging correction'20097,583,790'Direct conversion energy discriminating CT detector with over-ranging correction'20097,573,040'Energy discriminating detector different materials direct conversion layers'20097,570,736'Direct conversion energy discriminating CT detector with over-ranging correction'20097,554,089'Systems and methods to localize optical emission in radiation detectors'20097,492,855'System and method for detecting an object'20097,488,945'Subpixel routing and processing for an imaging system or the like'20097,466,793'Distinct incident energy spectra detection'20087,450,683'Tileable multi-layer detector'20087,428,292'Method and system for CT imaging using multi-spot emission sources'20087,415,093'Method and apparatus of CT cardiac diagnostic imaging using motion a priori information from 3D ultrasound and ECG gating'20087,403,589'Photon counting CT detector using solid-state photomultiplier and scintillator'20087,388,534'Adaptive data acquisition for an imaging system'20087,378,659'Systems and methods to localize optical emission in radiation detectors'20087,366,279'Scatter control system and method for computed tomography'20087,308,073'X-ray filter having dynamically displaceable x-ray attenuating fluid'20077,260,174'Direct conversion energy discriminating CT detector with over-ranging correction'20077,212,604'Multi-layer direct conversion computed tomography detector module'20077,193,208'Time-of-flight capable high resolution pet detector'20077,098,460'Monolithic structure for x-ray CT collimator'20067,084,403'Scintillator compositions, and related processes and articles of manufacture'20067,031,426'Methods and system for detecting components of plaque'20066,904,120'Method and apparatus for correcting bone induced spectral artifacts'20056,904,118'Method and apparatus for generating a density map using dual-energy CT'20056,848,827'Method and apparatus for calibrating detector spectral response'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2015Patents assigned to GEN ELECTRIC (34)· patent assignee history
2005–2015Based in Niskayuna, NY, US· patent location history
2006Patents assigned to GE MED SYS GLOBAL TECH CO LLC (1)· patent assignee history
2012Patents assigned to LANGAN DAVID ALLEN (1)· patent assignee history
2012Patents assigned to LEBLANC JAMES WALTER (1)· patent assignee history
2012Patents assigned to WU XIAOYE (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 34 | 2005–2015 |
| GE MED SYS GLOBAL TECH CO LLC | 1 | 2006 |
| LANGAN DAVID ALLEN | 1 | 2012 |
| LEBLANC JAMES WALTERself | 1 | 2012 |
| WU XIAOYE | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 35 | 2005–2015 |