Inventor
Ira L. Morgan
Inventor
Austin, TX, US
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties41%
G01BMeasuring length, thickness or similar linear dimensions24%
A61BDiagnosis12%
B21BRolling of metal12%
G21GConversion of chemical elements6%
H05HPlasma technique6%
PatentTitleYear
6,444,990'Multiple target, multiple energy radioisotope production'20025,614,720'Mobile, multi-mode apparatus and method for nondestructively inspecting components of an operating system'19975,608,660'Automated system for controlling the quality of geometrically regular-shaped products during their manufacture'19975,420,427'Mobile, multi-mode apparatus and method for nondestructively inspecting components of an operating system'19955,414,648'Nondestructively determining the dimensional changes of an object as a function of temperature'19955,379,237'Automated system for controlling the quality of regularly-shaped products during their manufacture'19954,725,963'Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects'19884,437,006'Method and apparatus for measuring radiation in computer-assisted tomography and radiographic applications'19844,284,895'Method and apparatus for tomographic examination of an object by penetrating radiation'1981Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1981Patents assigned to MORGAN IRA LON (1)· patent assignee history
1981–1997Based in Austin, TX, US· patent location history
1984Patents assigned to SCIENT MEASUREMENT SYSTEMS INC (1)· patent assignee history
1988Patents assigned to SCIENT MEASUREMENT SYSTEMS I L (1)· patent assignee history
1995–1997Patents assigned to INTEGRATED DIAGNOSTIC MEASUREM (5)· patent assignee history
2002Patents assigned to ADVANCED MOLECULAR IMAGING SYS (1)· patent assignee history
2002Based in Denton, TX, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INTEGRATED DIAGNOSTIC MEASUREM | 5 | 1995–1997 |
| ADVANCED MOLECULAR IMAGING SYS | 1 | 2002 |
| MORGAN IRA LONself | 1 | 1981 |
| SCIENT MEASUREMENT SYSTEMS I L | 1 | 1988 |
| SCIENT MEASUREMENT SYSTEMS INC | 1 | 1984 |
Locations
| Location | Patents | Span |
|---|---|---|
| Austin, Texas, US | 8 | 1981–1997 |
| Denton, Texas, US | 1 | 2002 |