Inventor
Gil Abramovich
Inventor
Niskayuna, NY, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus25%
G06VImage or video recognition or understanding17%
H04NPictorial communication, e.g. television13%
G06TImage data processing or generation, in general10%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
G06KGraphical data reading6%
G01BMeasuring length, thickness or similar linear dimensions4%
G01MTesting static or dynamic balance of machines or structures4%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them4%
Y10TTechnical subjects covered by former us classification4%
PatentTitleYear
10,809,148Combined gas leakage detection and quantification202010,724,919Systems and methods for quantifying a gas leak20209,536,127'Apparatus and method for contactless high resolution handprint capture'20179,342,728'System and method for contactless multi-fingerprint collection'20169,188,543'Inspection device and method thereof'20159,148,632'Multi-resolution optical system and method of fabricating same'20159,025,067'Apparatus and method for image super-resolution using integral shifting optics'20159,007,689'Method and apparatus for forming multiple images'20158,971,588'Apparatus and method for contactless high resolution handprint capture'20158,737,756'System and method for depth from defocus imaging'20148,600,123'System and method for contactless multi-fingerprint collection'20138,508,589'Imaging systems and associated methods thereof'20138,482,594'Multi-resolution optical system and method of fabricating same'20138,406,487'Method and system for contactless fingerprint detection and verification'20138,340,456'System and method for depth from defocus imaging'20128,045,181'Inspection system and method with multi-image phase shift analysis'20117,925,075'Inspection system and methods with autocompensation for edge break gauging orientation'20117,168,822'Reconfigurable linescan illumination'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007Based in Ann Arbor, MI, US· patent location history
2011–2017Patents assigned to GEN ELECTRIC (15)· patent assignee history
2011–2017Based in Niskayuna, NY, US· patent location history
2012–2015Patents assigned to ABRAMOVICH GIL (8)· patent assignee history
2012–2015Patents assigned to HARDING KEVIN GEORGE (8)· patent assignee history
2012–2013Patents assigned to GRAY DANIEL CURTIS (2)· patent assignee history
2013–2015Patents assigned to CZECHOWSKI III JOSEPH (2)· patent assignee history
2020Based in Karmiel, IL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 15 | 2011–2017 |
| ABRAMOVICH GILself | 8 | 2012–2015 |
| HARDING KEVIN GEORGE | 8 | 2012–2015 |
| CZECHOWSKI III JOSEPH | 2 | 2013–2015 |
| GRAY DANIEL CURTIS | 2 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 15 | 2011–2017 |
| Karmiel, IL | 2 | 2020 |
| Ann Arbor, MI, US | 1 | 2007 |