Inventor
Craig E. Uhrich
Inventor
Redwood City, CA, US
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties27%
G02BOptical elements, systems or apparatus21%
G01BMeasuring length, thickness or similar linear dimensions17%
H04NPictorial communication, e.g. television17%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them10%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light6%
G06TImage data processing or generation, in general2%
PatentTitleYear
9,917,990'Imaging systems with movable scan mirrors'20189,628,676'Imaging systems with movable scan mirrors'20179,488,823'Techniques for scanned illumination'20169,285,578'Method for imaging high density biochemical arrays with sub-pixel alignment'20168,965,196'Method and system for imaging high density biochemical arrays with sub-pixel alignment'20158,660,421'Method and system for imaging high density biochemical arrays with sub-pixel alignment'20148,428,454'Method and system for imaging high density biochemical arrays with sub-pixel alignment'20138,175,452'Method and system for imaging high density biochemical arrays with sub-pixel alignment'20126,987,832'Calibration and alignment of X-ray reflectometric systems'20066,940,596'Refractive focusing element for spectroscopic ellipsometry'20056,934,025'Thin film optical measurement system and method with calibrating ellipsometer'20056,885,019'Sample positioning system to improve edge measurements'20056,829,049'Small spot spectroscopic ellipsometer with refractive focusing'20046,768,785'Calibration and alignment of X-ray reflectometric systems'20046,753,962'Thin film optical measurement system and method with calibrating ellipsometer'20046,744,850'X-ray reflectance measurement system with adjustable resolution'20046,707,056'Stage rotation system to improve edge measurements'20046,643,354'Calibration and alignment of X-ray reflectometric systems'20036,515,746'Thin film optical measurement system and method with calibrating ellipsometer'20036,453,006'Calibration and alignment of X-ray reflectometric systems'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2005Patents assigned to THERMA WAVE INC (11)· patent assignee history
2002–2016Based in Redwood City, CA, US· patent location history
2006Patents assigned to KLA TENCOR TECH CORP (1)· patent assignee history
2012–2018Patents assigned to COMPLETE GENOMICS INC (8)· patent assignee history
2012–2013Patents assigned to STAKER BRYAN P (2)· patent assignee history
2012–2013Patents assigned to UHRICH CRAIG E (2)· patent assignee history
2016–2018Based in Mountain View, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| THERMA WAVE INC | 11 | 2002–2005 |
| COMPLETE GENOMICS INC | 8 | 2012–2018 |
| STAKER BRYAN P | 2 | 2012–2013 |
| UHRICH CRAIG Eself | 2 | 2012–2013 |
| KLA TENCOR TECH CORP | 1 | 2006 |
Locations
| Location | Patents | Span |
|---|---|---|
| Redwood City, California, US | 17 | 2002–2016 |
| Mountain View, California, US | 3 | 2016–2018 |